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X-RAY DIFFRACTION
Materials and Methods page
4I5S
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 298.0
    Details 2.3-2.9M SODIUM FORMATE, 3% PEG 4000, PH 7.6-8.6, VAPOR DIFFUSION, HANGING DROP, TEMPERATURE 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 153.12 α = 90
    b = 153.12 β = 90
    c = 125.11 γ = 120
     
    Space Group
    Space Group Name:    P 31 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2010-01-07
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.9792
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.8
    Observed Criterion Sigma(I) 21.1
    Resolution(High) 3.3
    Resolution(Low) 50
    Number Reflections(Observed) 25746
    Percent Possible(Observed) 99.5
    B(Isotropic) From Wilson Plot 102.0
    Redundancy 5.9
     
    High Resolution Shell Details
    Resolution(High) 3.3
    Resolution(Low) 3.42
    Percent Possible(All) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 3.3
    Resolution(Low) 36.62
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 25719
    Number of Reflections(R-Free) 1451
    Percent Reflections(Observed) 99.6
    R-Factor(Observed) 0.233
    R-Work 0.23
    R-Free 0.27
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 151.341
    Anisotropic B[1][1] 10.7354
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 10.7354
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -21.4708
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.301
    Shell Resolution(Low) 3.4189
    Number of Reflections(R-Free) 415
    Number of Reflections(R-Work) 2145
    R-Factor(R-Work) 0.3101
    R-Factor(R-Free) 0.3736
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4189
    Shell Resolution(Low) 3.5557
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 2531
    R-Factor(R-Work) 0.2853
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5557
    Shell Resolution(Low) 3.7174
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 2557
    R-Factor(R-Work) 0.2543
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7174
    Shell Resolution(Low) 3.9132
    Number of Reflections(R-Free) 343
    Number of Reflections(R-Work) 2183
    R-Factor(R-Work) 0.2461
    R-Factor(R-Free) 0.3058
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9132
    Shell Resolution(Low) 4.158
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 2561
    R-Factor(R-Work) 0.2288
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.158
    Shell Resolution(Low) 4.4785
    Number of Reflections(R-Free) 316
    Number of Reflections(R-Work) 2251
    R-Factor(R-Work) 0.1988
    R-Factor(R-Free) 0.227
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4785
    Shell Resolution(Low) 4.9283
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 2575
    R-Factor(R-Work) 0.1807
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9283
    Shell Resolution(Low) 5.6392
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 2589
    R-Factor(R-Work) 0.2165
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6392
    Shell Resolution(Low) 7.0963
    Number of Reflections(R-Free) 239
    Number of Reflections(R-Work) 2355
    R-Factor(R-Work) 0.3177
    R-Factor(R-Free) 0.4145
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.0963
    Shell Resolution(Low) 36.6257
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2521
    R-Factor(R-Work) 0.2113
    R-Factor(R-Free) 0.1855
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.065
    f_dihedral_angle_d 18.327
    f_angle_d 0.934
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6233
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASES
    Structure Refinement PHENIX (PHENIX.REFINE: 1.7.1_743)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.7.1_743)
    model building PHASES
    data collection HKL-2000