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X-RAY DIFFRACTION
Materials and Methods page
4I55
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.7
    Temperature 293.0
    Details 3% PEG 4000, 4-6% glycerol, 30 mM magnesium chloride, 30 mM calcium chloride, 100 mM MES/Imidazole , pH 6.7, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 104.16 α = 90
    b = 156.47 β = 90
    c = 181.49 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Collection Date 2012-02-03
     
    Diffraction Radiation
    Monochromator LN2 cooled fixed-exit Si(111) monochromator, Sagittally - horizontally focussed
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06SA
    Wavelength List 0.99995
    Site SLS
    Beamline X06SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.2
    Resolution(Low) 71.84
    Number Reflections(All) 149411
    Number Reflections(Observed) 149411
    Percent Possible(Observed) 99.2
    R Merge I(Observed) 0.094
    B(Isotropic) From Wilson Plot 45.7
    Redundancy 13.2
     
    High Resolution Shell Details
    Resolution(High) 2.2
    Resolution(Low) 2.26
    Percent Possible(All) 93.9
    Mean I Over Sigma(Observed) 2.2
    Redundancy 11.9
    Number Unique Reflections(All) 10355
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.2
    Resolution(Low) 71.844
    Number of Reflections(all) 149390
    Number of Reflections(Observed) 149390
    Number of Reflections(R-Free) 7514
    Percent Reflections(Observed) 99.23
    R-Factor(All) 0.1695
    R-Factor(Observed) 0.1695
    R-Work 0.1675
    R-Free 0.2077
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 6.9646
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 7.1804
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.397
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2
    Shell Resolution(Low) 2.225
    Number of Reflections(R-Free) 227
    Number of Reflections(R-Work) 4223
    R-Factor(R-Work) 0.2523
    R-Factor(R-Free) 0.2847
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.225
    Shell Resolution(Low) 2.2512
    Number of Reflections(R-Free) 239
    Number of Reflections(R-Work) 4573
    R-Factor(R-Work) 0.2477
    R-Factor(R-Free) 0.3209
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2512
    Shell Resolution(Low) 2.2786
    Number of Reflections(R-Free) 240
    Number of Reflections(R-Work) 4669
    R-Factor(R-Work) 0.244
    R-Factor(R-Free) 0.307
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2786
    Shell Resolution(Low) 2.3075
    Number of Reflections(R-Free) 272
    Number of Reflections(R-Work) 4673
    R-Factor(R-Work) 0.2309
    R-Factor(R-Free) 0.2661
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3075
    Shell Resolution(Low) 2.3379
    Number of Reflections(R-Free) 248
    Number of Reflections(R-Work) 4664
    R-Factor(R-Work) 0.2179
    R-Factor(R-Free) 0.2639
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3379
    Shell Resolution(Low) 2.3699
    Number of Reflections(R-Free) 259
    Number of Reflections(R-Work) 4695
    R-Factor(R-Work) 0.2122
    R-Factor(R-Free) 0.2678
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3699
    Shell Resolution(Low) 2.4037
    Number of Reflections(R-Free) 251
    Number of Reflections(R-Work) 4704
    R-Factor(R-Work) 0.2089
    R-Factor(R-Free) 0.2684
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4037
    Shell Resolution(Low) 2.4396
    Number of Reflections(R-Free) 256
    Number of Reflections(R-Work) 4706
    R-Factor(R-Work) 0.2117
    R-Factor(R-Free) 0.2742
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4396
    Shell Resolution(Low) 2.4777
    Number of Reflections(R-Free) 253
    Number of Reflections(R-Work) 4674
    R-Factor(R-Work) 0.1994
    R-Factor(R-Free) 0.2748
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4777
    Shell Resolution(Low) 2.5184
    Number of Reflections(R-Free) 242
    Number of Reflections(R-Work) 4707
    R-Factor(R-Work) 0.2045
    R-Factor(R-Free) 0.2766
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5184
    Shell Resolution(Low) 2.5618
    Number of Reflections(R-Free) 253
    Number of Reflections(R-Work) 4680
    R-Factor(R-Work) 0.2095
    R-Factor(R-Free) 0.2899
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5618
    Shell Resolution(Low) 2.6084
    Number of Reflections(R-Free) 252
    Number of Reflections(R-Work) 4740
    R-Factor(R-Work) 0.1976
    R-Factor(R-Free) 0.2512
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6084
    Shell Resolution(Low) 2.6586
    Number of Reflections(R-Free) 231
    Number of Reflections(R-Work) 4713
    R-Factor(R-Work) 0.1936
    R-Factor(R-Free) 0.2315
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6586
    Shell Resolution(Low) 2.7128
    Number of Reflections(R-Free) 242
    Number of Reflections(R-Work) 4695
    R-Factor(R-Work) 0.1944
    R-Factor(R-Free) 0.2454
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7128
    Shell Resolution(Low) 2.7718
    Number of Reflections(R-Free) 283
    Number of Reflections(R-Work) 4673
    R-Factor(R-Work) 0.1861
    R-Factor(R-Free) 0.2399
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7718
    Shell Resolution(Low) 2.8363
    Number of Reflections(R-Free) 257
    Number of Reflections(R-Work) 4748
    R-Factor(R-Work) 0.1795
    R-Factor(R-Free) 0.2456
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8363
    Shell Resolution(Low) 2.9072
    Number of Reflections(R-Free) 217
    Number of Reflections(R-Work) 4758
    R-Factor(R-Work) 0.1779
    R-Factor(R-Free) 0.2236
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9072
    Shell Resolution(Low) 2.9858
    Number of Reflections(R-Free) 235
    Number of Reflections(R-Work) 4769
    R-Factor(R-Work) 0.1687
    R-Factor(R-Free) 0.2309
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9858
    Shell Resolution(Low) 3.0737
    Number of Reflections(R-Free) 245
    Number of Reflections(R-Work) 4767
    R-Factor(R-Work) 0.1647
    R-Factor(R-Free) 0.204
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0737
    Shell Resolution(Low) 3.1729
    Number of Reflections(R-Free) 245
    Number of Reflections(R-Work) 4739
    R-Factor(R-Work) 0.1729
    R-Factor(R-Free) 0.2177
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1729
    Shell Resolution(Low) 3.2863
    Number of Reflections(R-Free) 225
    Number of Reflections(R-Work) 4768
    R-Factor(R-Work) 0.1779
    R-Factor(R-Free) 0.2394
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2863
    Shell Resolution(Low) 3.4179
    Number of Reflections(R-Free) 285
    Number of Reflections(R-Work) 4728
    R-Factor(R-Work) 0.1743
    R-Factor(R-Free) 0.2229
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4179
    Shell Resolution(Low) 3.5734
    Number of Reflections(R-Free) 260
    Number of Reflections(R-Work) 4779
    R-Factor(R-Work) 0.1634
    R-Factor(R-Free) 0.2189
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5734
    Shell Resolution(Low) 3.7618
    Number of Reflections(R-Free) 250
    Number of Reflections(R-Work) 4766
    R-Factor(R-Work) 0.158
    R-Factor(R-Free) 0.1694
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7618
    Shell Resolution(Low) 3.9975
    Number of Reflections(R-Free) 249
    Number of Reflections(R-Work) 4809
    R-Factor(R-Work) 0.1499
    R-Factor(R-Free) 0.1935
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9975
    Shell Resolution(Low) 4.3061
    Number of Reflections(R-Free) 248
    Number of Reflections(R-Work) 4801
    R-Factor(R-Work) 0.132
    R-Factor(R-Free) 0.1759
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3061
    Shell Resolution(Low) 4.7394
    Number of Reflections(R-Free) 251
    Number of Reflections(R-Work) 4852
    R-Factor(R-Work) 0.1192
    R-Factor(R-Free) 0.1455
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7394
    Shell Resolution(Low) 5.425
    Number of Reflections(R-Free) 273
    Number of Reflections(R-Work) 4812
    R-Factor(R-Work) 0.1299
    R-Factor(R-Free) 0.154
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.425
    Shell Resolution(Low) 6.834
    Number of Reflections(R-Free) 242
    Number of Reflections(R-Work) 4918
    R-Factor(R-Work) 0.1753
    R-Factor(R-Free) 0.2176
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.834
    Shell Resolution(Low) 71.8824
    Number of Reflections(R-Free) 284
    Number of Reflections(R-Work) 5073
    R-Factor(R-Work) 0.1819
    R-Factor(R-Free) 0.1969
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.063
    f_dihedral_angle_d 16.565
    f_angle_d 1.111
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 17470
    Nucleic Acid Atoms 0
    Heterogen Atoms 187
    Solvent Atoms 765
     
     
  •   Software and Computing Hide
    Computing
    Data Collection REMDAQ
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building PHASER
    data collection REMDAQ