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X-RAY DIFFRACTION
Materials and Methods page
4I4R
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.5
    Temperature 293.0
    Details 0.1 M Tris-HCl, 0.2 M magnesium chloride, 25% PEG4000, 0.2 M 1-butyl-3-methylimidazolium chloride, pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 65.42 α = 90
    b = 70.03 β = 106.84
    c = 71.83 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2011-06-22
     
    Diffraction Radiation
    Monochromator Diamond(001)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-1
    Wavelength List 0.93340
    Site ESRF
    Beamline ID14-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.77
    Resolution(Low) 30
    Number Reflections(All) 59260
    Number Reflections(Observed) 59260
    Percent Possible(Observed) 98.0
    R Merge I(Observed) 0.074
    B(Isotropic) From Wilson Plot 19.8
    Redundancy 3.4
     
    High Resolution Shell Details
    Resolution(High) 1.77
    Resolution(Low) 1.87
    Percent Possible(All) 97.0
    R Merge I(Observed) 0.355
    Mean I Over Sigma(Observed) 3.2
    Redundancy 3.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.77
    Resolution(Low) 24.635
    Cut-off Sigma(F) 1.36
    Number of Reflections(all) 59224
    Number of Reflections(Observed) 59224
    Number of Reflections(R-Free) 2997
    Percent Reflections(Observed) 97.77
    R-Factor(Observed) 0.1786
    R-Work 0.1764
    R-Free 0.2197
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.2061
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.2489
    Anisotropic B[2][2] 0.2074
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.4135
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.77
    Shell Resolution(Low) 1.799
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2647
    R-Factor(R-Work) 0.2473
    R-Factor(R-Free) 0.3046
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.799
    Shell Resolution(Low) 1.83
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2591
    R-Factor(R-Work) 0.2353
    R-Factor(R-Free) 0.2812
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.83
    Shell Resolution(Low) 1.8633
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2653
    R-Factor(R-Work) 0.2171
    R-Factor(R-Free) 0.2841
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8633
    Shell Resolution(Low) 1.8991
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2624
    R-Factor(R-Work) 0.2048
    R-Factor(R-Free) 0.2497
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8991
    Shell Resolution(Low) 1.9379
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.1828
    R-Factor(R-Free) 0.2607
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9379
    Shell Resolution(Low) 1.98
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2647
    R-Factor(R-Work) 0.1768
    R-Factor(R-Free) 0.2276
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.98
    Shell Resolution(Low) 2.026
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2631
    R-Factor(R-Work) 0.1754
    R-Factor(R-Free) 0.2338
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.026
    Shell Resolution(Low) 2.0767
    Number of Reflections(R-Free) 114
    Number of Reflections(R-Work) 2721
    R-Factor(R-Work) 0.1707
    R-Factor(R-Free) 0.2372
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0767
    Shell Resolution(Low) 2.1328
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2679
    R-Factor(R-Work) 0.1685
    R-Factor(R-Free) 0.23
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1328
    Shell Resolution(Low) 2.1955
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2654
    R-Factor(R-Work) 0.1728
    R-Factor(R-Free) 0.2429
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1955
    Shell Resolution(Low) 2.2664
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2661
    R-Factor(R-Work) 0.171
    R-Factor(R-Free) 0.2058
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2664
    Shell Resolution(Low) 2.3473
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2687
    R-Factor(R-Work) 0.1717
    R-Factor(R-Free) 0.229
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3473
    Shell Resolution(Low) 2.4412
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2642
    R-Factor(R-Work) 0.1754
    R-Factor(R-Free) 0.2021
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4412
    Shell Resolution(Low) 2.5522
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2704
    R-Factor(R-Work) 0.1737
    R-Factor(R-Free) 0.2107
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5522
    Shell Resolution(Low) 2.6866
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2712
    R-Factor(R-Work) 0.1707
    R-Factor(R-Free) 0.2504
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6866
    Shell Resolution(Low) 2.8547
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2667
    R-Factor(R-Work) 0.1884
    R-Factor(R-Free) 0.2324
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8547
    Shell Resolution(Low) 3.0747
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2695
    R-Factor(R-Work) 0.1813
    R-Factor(R-Free) 0.2169
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0747
    Shell Resolution(Low) 3.3834
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2705
    R-Factor(R-Work) 0.1851
    R-Factor(R-Free) 0.2159
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3834
    Shell Resolution(Low) 3.8714
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2742
    R-Factor(R-Work) 0.1652
    R-Factor(R-Free) 0.2071
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8714
    Shell Resolution(Low) 4.8714
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.1445
    R-Factor(R-Free) 0.1609
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8714
    Shell Resolution(Low) 24.6372
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2786
    R-Factor(R-Work) 0.1848
    R-Factor(R-Free) 0.2209
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.081
    f_dihedral_angle_d 11.051
    f_angle_d 1.06
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4756
    Nucleic Acid Atoms 0
    Heterogen Atoms 48
    Solvent Atoms 502
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MXCuBE
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution MOLREP
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    model building MOLREP
    data collection MXCuBE