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X-RAY DIFFRACTION
Materials and Methods page
4I4P
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.5
    Temperature 293.0
    Details 0.1 M Tris-HCl, 0.2 M magnesium chloride, 25% PEG4000, 0.2 M 1-butyl-3-methylimidazolium chloride, pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 41.58 α = 90
    b = 66.58 β = 90
    c = 105.05 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2011-06-22
     
    Diffraction Radiation
    Monochromator Diamond(001)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-1
    Wavelength List 0.93340
    Site ESRF
    Beamline ID14-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.28
    Resolution(Low) 30
    Number Reflections(All) 70848
    Number Reflections(Observed) 70848
    Percent Possible(Observed) 93.5
    R Merge I(Observed) 0.062
    B(Isotropic) From Wilson Plot 9.7
    Redundancy 6.5
     
    High Resolution Shell Details
    Resolution(High) 1.279
    Resolution(Low) 1.35
    Percent Possible(All) 86.5
    R Merge I(Observed) 0.279
    Mean I Over Sigma(Observed) 6.1
    Redundancy 6.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SIRAS
    reflnsShellList 1.279
    Resolution(Low) 19.845
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 70848
    Number of Reflections(Observed) 70792
    Number of Reflections(R-Free) 3564
    Percent Reflections(Observed) 93.01
    R-Factor(Observed) 0.1676
    R-Work 0.1666
    R-Free 0.185
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.1351
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.1521
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.017
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.279
    Shell Resolution(Low) 1.2965
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2246
    R-Factor(R-Work) 0.2018
    R-Factor(R-Free) 0.228
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2965
    Shell Resolution(Low) 1.315
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2532
    R-Factor(R-Work) 0.2091
    R-Factor(R-Free) 0.2403
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.315
    Shell Resolution(Low) 1.3347
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2511
    R-Factor(R-Work) 0.1965
    R-Factor(R-Free) 0.2541
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3347
    Shell Resolution(Low) 1.3555
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2512
    R-Factor(R-Work) 0.1797
    R-Factor(R-Free) 0.2033
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3555
    Shell Resolution(Low) 1.3777
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2559
    R-Factor(R-Work) 0.1754
    R-Factor(R-Free) 0.1999
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3777
    Shell Resolution(Low) 1.4015
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2524
    R-Factor(R-Work) 0.1719
    R-Factor(R-Free) 0.2089
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4015
    Shell Resolution(Low) 1.427
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2562
    R-Factor(R-Work) 0.1645
    R-Factor(R-Free) 0.1865
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.427
    Shell Resolution(Low) 1.4544
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2561
    R-Factor(R-Work) 0.1574
    R-Factor(R-Free) 0.224
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4544
    Shell Resolution(Low) 1.4841
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2565
    R-Factor(R-Work) 0.159
    R-Factor(R-Free) 0.175
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4841
    Shell Resolution(Low) 1.5163
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2582
    R-Factor(R-Work) 0.1493
    R-Factor(R-Free) 0.1794
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5163
    Shell Resolution(Low) 1.5516
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2584
    R-Factor(R-Work) 0.1509
    R-Factor(R-Free) 0.1739
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5516
    Shell Resolution(Low) 1.5904
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.1498
    R-Factor(R-Free) 0.1809
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5904
    Shell Resolution(Low) 1.6334
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2636
    R-Factor(R-Work) 0.1557
    R-Factor(R-Free) 0.1685
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6334
    Shell Resolution(Low) 1.6814
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2724
    R-Factor(R-Work) 0.1546
    R-Factor(R-Free) 0.173
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6814
    Shell Resolution(Low) 1.7356
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 2719
    R-Factor(R-Work) 0.1562
    R-Factor(R-Free) 0.1608
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7356
    Shell Resolution(Low) 1.7976
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2767
    R-Factor(R-Work) 0.1551
    R-Factor(R-Free) 0.1677
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7976
    Shell Resolution(Low) 1.8696
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2803
    R-Factor(R-Work) 0.1572
    R-Factor(R-Free) 0.1802
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8696
    Shell Resolution(Low) 1.9546
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2810
    R-Factor(R-Work) 0.1613
    R-Factor(R-Free) 0.161
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9546
    Shell Resolution(Low) 2.0575
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 2832
    R-Factor(R-Work) 0.1601
    R-Factor(R-Free) 0.1797
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0575
    Shell Resolution(Low) 2.1863
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2876
    R-Factor(R-Work) 0.1616
    R-Factor(R-Free) 0.1997
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1863
    Shell Resolution(Low) 2.3548
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2855
    R-Factor(R-Work) 0.1696
    R-Factor(R-Free) 0.2054
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3548
    Shell Resolution(Low) 2.5914
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2908
    R-Factor(R-Work) 0.1709
    R-Factor(R-Free) 0.1947
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5914
    Shell Resolution(Low) 2.9653
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2927
    R-Factor(R-Work) 0.1855
    R-Factor(R-Free) 0.1769
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9653
    Shell Resolution(Low) 3.7318
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2940
    R-Factor(R-Work) 0.1649
    R-Factor(R-Free) 0.1871
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7318
    Shell Resolution(Low) 19.8474
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 3072
    R-Factor(R-Work) 0.1697
    R-Factor(R-Free) 0.1699
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.084
    f_dihedral_angle_d 10.674
    f_angle_d 1.128
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2378
    Nucleic Acid Atoms 0
    Heterogen Atoms 32
    Solvent Atoms 412
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MXCuBE
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution SHARP
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    model building SHARP
    data collection MXCuBE