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X-RAY DIFFRACTION
Materials and Methods page
4I4O
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.5
    Temperature 293.0
    Details 0.1 M Tris-HCl, 1.5 M ammonium sulfate, 10% glycerol, pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 34.53 α = 90
    b = 66.83 β = 96.1
    c = 63.94 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Collection Date 2011-11-25
     
    Diffraction Radiation
    Monochromator channel-cut Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID29
    Wavelength List 1.03320
    Site ESRF
    Beamline ID29
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.12
    Resolution(Low) 63.6
    Number Reflections(All) 110718
    Number Reflections(Observed) 103662
    Percent Possible(Observed) 93.8
    R Merge I(Observed) 0.032
    B(Isotropic) From Wilson Plot 6.9
    Redundancy 2.7
     
    High Resolution Shell Details
    Resolution(High) 1.12
    Resolution(Low) 1.18
    Percent Possible(All) 81.6
    R Merge I(Observed) 0.092
    Mean I Over Sigma(Observed) 8.8
    Redundancy 2.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.12
    Resolution(Low) 29.579
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 103696
    Number of Reflections(Observed) 103652
    Number of Reflections(R-Free) 5191
    Percent Reflections(Observed) 93.62
    R-Factor(Observed) 0.1513
    R-Work 0.1509
    R-Free 0.1597
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -6.0E-4
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0184
    Anisotropic B[2][2] -0.011
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.0116
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.12
    Shell Resolution(Low) 1.1327
    Number of Reflections(R-Free) 111
    Number of Reflections(R-Work) 2418
    R-Factor(R-Work) 0.1613
    R-Factor(R-Free) 0.1673
    Percent Reflections(Observed) 69.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1327
    Shell Resolution(Low) 1.1461
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2719
    R-Factor(R-Work) 0.151
    R-Factor(R-Free) 0.1571
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1461
    Shell Resolution(Low) 1.16
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2927
    R-Factor(R-Work) 0.146
    R-Factor(R-Free) 0.1436
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.16
    Shell Resolution(Low) 1.1747
    Number of Reflections(R-Free) 186
    Number of Reflections(R-Work) 3120
    R-Factor(R-Work) 0.1417
    R-Factor(R-Free) 0.1539
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1747
    Shell Resolution(Low) 1.1902
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 3336
    R-Factor(R-Work) 0.1414
    R-Factor(R-Free) 0.1577
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.1902
    Shell Resolution(Low) 1.2065
    Number of Reflections(R-Free) 199
    Number of Reflections(R-Work) 3285
    R-Factor(R-Work) 0.1442
    R-Factor(R-Free) 0.1434
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2065
    Shell Resolution(Low) 1.2237
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 3330
    R-Factor(R-Work) 0.1394
    R-Factor(R-Free) 0.16
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2237
    Shell Resolution(Low) 1.242
    Number of Reflections(R-Free) 192
    Number of Reflections(R-Work) 3285
    R-Factor(R-Work) 0.1413
    R-Factor(R-Free) 0.1524
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.242
    Shell Resolution(Low) 1.2614
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 3302
    R-Factor(R-Work) 0.1419
    R-Factor(R-Free) 0.1607
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2614
    Shell Resolution(Low) 1.2821
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 3179
    R-Factor(R-Work) 0.1427
    R-Factor(R-Free) 0.1824
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2821
    Shell Resolution(Low) 1.3042
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 3247
    R-Factor(R-Work) 0.1416
    R-Factor(R-Free) 0.1443
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3042
    Shell Resolution(Low) 1.3279
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 3384
    R-Factor(R-Work) 0.1402
    R-Factor(R-Free) 0.1593
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3279
    Shell Resolution(Low) 1.3534
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 3309
    R-Factor(R-Work) 0.1453
    R-Factor(R-Free) 0.1571
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3534
    Shell Resolution(Low) 1.3811
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 3409
    R-Factor(R-Work) 0.1435
    R-Factor(R-Free) 0.1551
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3811
    Shell Resolution(Low) 1.4111
    Number of Reflections(R-Free) 205
    Number of Reflections(R-Work) 3283
    R-Factor(R-Work) 0.1397
    R-Factor(R-Free) 0.1472
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4111
    Shell Resolution(Low) 1.4439
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 3361
    R-Factor(R-Work) 0.1394
    R-Factor(R-Free) 0.139
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4439
    Shell Resolution(Low) 1.48
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 3241
    R-Factor(R-Work) 0.138
    R-Factor(R-Free) 0.1576
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.48
    Shell Resolution(Low) 1.5201
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 3381
    R-Factor(R-Work) 0.1342
    R-Factor(R-Free) 0.1379
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5201
    Shell Resolution(Low) 1.5648
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 3399
    R-Factor(R-Work) 0.1264
    R-Factor(R-Free) 0.1402
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5648
    Shell Resolution(Low) 1.6153
    Number of Reflections(R-Free) 181
    Number of Reflections(R-Work) 3365
    R-Factor(R-Work) 0.1302
    R-Factor(R-Free) 0.1476
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6153
    Shell Resolution(Low) 1.673
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 3439
    R-Factor(R-Work) 0.1356
    R-Factor(R-Free) 0.1348
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.673
    Shell Resolution(Low) 1.74
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 3415
    R-Factor(R-Work) 0.1414
    R-Factor(R-Free) 0.1595
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.74
    Shell Resolution(Low) 1.8192
    Number of Reflections(R-Free) 198
    Number of Reflections(R-Work) 3253
    R-Factor(R-Work) 0.1449
    R-Factor(R-Free) 0.1507
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8192
    Shell Resolution(Low) 1.9151
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 3432
    R-Factor(R-Work) 0.1444
    R-Factor(R-Free) 0.1534
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9151
    Shell Resolution(Low) 2.035
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 3465
    R-Factor(R-Work) 0.1543
    R-Factor(R-Free) 0.1716
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.035
    Shell Resolution(Low) 2.1921
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 3481
    R-Factor(R-Work) 0.1544
    R-Factor(R-Free) 0.1549
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1921
    Shell Resolution(Low) 2.4126
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 3440
    R-Factor(R-Work) 0.1579
    R-Factor(R-Free) 0.1693
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4126
    Shell Resolution(Low) 2.7615
    Number of Reflections(R-Free) 186
    Number of Reflections(R-Work) 3338
    R-Factor(R-Work) 0.1708
    R-Factor(R-Free) 0.1608
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7615
    Shell Resolution(Low) 3.4783
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 3476
    R-Factor(R-Work) 0.1693
    R-Factor(R-Free) 0.1883
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4783
    Shell Resolution(Low) 29.5889
    Number of Reflections(R-Free) 194
    Number of Reflections(R-Work) 3442
    R-Factor(R-Work) 0.1596
    R-Factor(R-Free) 0.1626
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.083
    f_dihedral_angle_d 11.811
    f_angle_d 1.146
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2378
    Nucleic Acid Atoms 0
    Heterogen Atoms 65
    Solvent Atoms 380
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MXCuBE
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution MOLREP
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    model building MOLREP
    data collection MXCuBE