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X-RAY DIFFRACTION
Materials and Methods page
4I4J
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.6
    Temperature 289.0
    Details 0.2 M ammonium tartrate dibasic pH 6.6, 20 %(v/v) PEG3350, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 57.42 α = 90
    b = 184.53 β = 95.6
    c = 59.4 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirrors
    Collection Date 2012-08-23
     
    Diffraction Radiation
    Monochromator double crystal monochromator
    Diffraction Protocol SAD
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97931
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.78
    Resolution(Low) 50
    Number Reflections(All) 30094
    Number Reflections(Observed) 30094
    Percent Possible(Observed) 99.5
    B(Isotropic) From Wilson Plot 69.07
    Redundancy 3.8
     
    High Resolution Shell Details
    Resolution(High) 2.8
    Resolution(Low) 2.85
    Percent Possible(All) 100.0
    Mean I Over Sigma(Observed) 1.9
    R-Sym I(Observed) 0.929
    Redundancy 3.8
    Number Unique Reflections(All) 1549
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.784
    Resolution(Low) 39.16
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 29376
    Number of Reflections(Observed) 29376
    Number of Reflections(R-Free) 1972
    Percent Reflections(Observed) 95.54
    R-Factor(All) 0.215
    R-Factor(Observed) 0.215
    R-Work 0.211
    R-Free 0.27
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Isotropic Thermal Model mixed
    Mean Isotropic B Value 36.0
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7842
    Shell Resolution(Low) 2.8538
    Number of Reflections(Observed) 1534
    Number of Reflections(R-Free) 100
    Number of Reflections(R-Work) 1434
    R-Factor(R-Work) 0.3092
    R-Factor(R-Free) 0.3934
    Percent Reflections(Observed) 69.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8538
    Shell Resolution(Low) 2.931
    Number of Reflections(Observed) 2032
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1897
    R-Factor(R-Work) 0.3102
    R-Factor(R-Free) 0.369
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.931
    Shell Resolution(Low) 3.0172
    Number of Reflections(Observed) 2108
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1962
    R-Factor(R-Work) 0.2846
    R-Factor(R-Free) 0.3487
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0172
    Shell Resolution(Low) 3.1145
    Number of Reflections(Observed) 2084
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1940
    R-Factor(R-Work) 0.279
    R-Factor(R-Free) 0.3318
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1145
    Shell Resolution(Low) 3.2258
    Number of Reflections(Observed) 2105
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 1972
    R-Factor(R-Work) 0.2705
    R-Factor(R-Free) 0.3385
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2258
    Shell Resolution(Low) 3.3549
    Number of Reflections(Observed) 2159
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2006
    R-Factor(R-Work) 0.2559
    R-Factor(R-Free) 0.3154
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3549
    Shell Resolution(Low) 3.5075
    Number of Reflections(Observed) 2162
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2020
    R-Factor(R-Work) 0.2255
    R-Factor(R-Free) 0.3228
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5075
    Shell Resolution(Low) 3.6923
    Number of Reflections(Observed) 2156
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2016
    R-Factor(R-Work) 0.2118
    R-Factor(R-Free) 0.2787
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6923
    Shell Resolution(Low) 3.9234
    Number of Reflections(Observed) 2196
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2045
    R-Factor(R-Work) 0.2249
    R-Factor(R-Free) 0.2717
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9234
    Shell Resolution(Low) 4.226
    Number of Reflections(Observed) 2158
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2011
    R-Factor(R-Work) 0.1912
    R-Factor(R-Free) 0.2317
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.226
    Shell Resolution(Low) 4.6507
    Number of Reflections(Observed) 2114
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1972
    R-Factor(R-Work) 0.1639
    R-Factor(R-Free) 0.2324
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6507
    Shell Resolution(Low) 5.3222
    Number of Reflections(Observed) 2178
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2033
    R-Factor(R-Work) 0.1758
    R-Factor(R-Free) 0.2236
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3222
    Shell Resolution(Low) 6.7
    Number of Reflections(Observed) 2192
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2046
    R-Factor(R-Work) 0.2263
    R-Factor(R-Free) 0.285
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.7
    Shell Resolution(Low) 39.1641
    Number of Reflections(Observed) 2198
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2050
    R-Factor(R-Work) 0.1882
    R-Factor(R-Free) 0.2432
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.041
    f_dihedral_angle_d 12.957
    f_angle_d 0.604
    f_bond_d 0.002
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 9082
    Nucleic Acid Atoms 0
    Heterogen Atoms 46
    Solvent Atoms 95
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBCCOLLECT, HKL3000
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution HKL3000, phenix
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1161)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1161)
    model building phenix
    model building HKL3000
    data collection HKL3000
    data collection SBCCOLLECT