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X-RAY DIFFRACTION
Materials and Methods page
4I4A
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8.5
    Temperature 289.0
    Details 0.2 M Li2SO4, 0.1 M Tris/HCl 8.5, 25% PEG400, VAPOR DIFFUSION, SITTING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 55.74 α = 90
    b = 147.69 β = 90
    c = 83.84 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirrors
    Collection Date 2012-10-22
     
    Diffraction Radiation
    Monochromator double crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97915
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.35
    Resolution(Low) 30
    Number Reflections(All) 76260
    Number Reflections(Observed) 76134
    Percent Possible(Observed) 99.8
    R Merge I(Observed) 0.084
    B(Isotropic) From Wilson Plot 15.4
    Redundancy 7.1
     
    High Resolution Shell Details
    Resolution(High) 1.35
    Resolution(Low) 1.37
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.891
    Mean I Over Sigma(Observed) 2.0
    Redundancy 6.9
    Number Unique Reflections(All) 3769
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.349
    Resolution(Low) 24.898
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 76093
    Number of Reflections(Observed) 76093
    Number of Reflections(R-Free) 1113
    Percent Reflections(Observed) 99.74
    R-Factor(All) 0.154
    R-Factor(Observed) 0.154
    R-Work 0.1537
    R-Free 0.1745
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Isotropic Thermal Model anisotropic for all atoms
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3493
    Shell Resolution(Low) 1.4107
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 9240
    R-Factor(R-Work) 0.1931
    R-Factor(R-Free) 0.2293
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4107
    Shell Resolution(Low) 1.485
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 9274
    R-Factor(R-Work) 0.1574
    R-Factor(R-Free) 0.1901
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.485
    Shell Resolution(Low) 1.578
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 9330
    R-Factor(R-Work) 0.1291
    R-Factor(R-Free) 0.1636
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.578
    Shell Resolution(Low) 1.6999
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 9330
    R-Factor(R-Work) 0.1142
    R-Factor(R-Free) 0.1435
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6999
    Shell Resolution(Low) 1.8709
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 9347
    R-Factor(R-Work) 0.1169
    R-Factor(R-Free) 0.1554
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8709
    Shell Resolution(Low) 2.1415
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 9423
    R-Factor(R-Work) 0.1247
    R-Factor(R-Free) 0.1559
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1415
    Shell Resolution(Low) 2.6975
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 9417
    R-Factor(R-Work) 0.1571
    R-Factor(R-Free) 0.1686
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6975
    Shell Resolution(Low) 24.9019
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 9619
    R-Factor(R-Work) 0.1786
    R-Factor(R-Free) 0.1888
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.08
    f_dihedral_angle_d 13.938
    f_angle_d 1.255
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2021
    Nucleic Acid Atoms 0
    Heterogen Atoms 3
    Solvent Atoms 270
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBCcollect
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution SHELX, MLPHARE, DM, Buccaneer, ARP/WARP, COOT
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building COOT
    model building ARP/WARP
    model building Buccaneer
    model building DM
    model building MLPHARE
    model building SHELX
    data collection SBCcollect