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X-RAY DIFFRACTION
Materials and Methods page
4I49
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 5.6
    Temperature 291.0
    Details 100 mM Tri-Na citrate, 0.2M MgCl2, 8% PEG3350 , pH 5.6, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 98.52 α = 90
    b = 98.52 β = 90
    c = 90.01 γ = 120
     
    Space Group
    Space Group Name:    P 3 1 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 298
     
    Diffraction Detector
    Detector CCD
    Type RIGAKU
    Collection Date 2011-07-20
     
    Diffraction Radiation
    Monochromator Ni FILTER
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type Cu FINE FOCUS
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.75
    Resolution(Low) 50
    Number Reflections(All) 13177
    Number Reflections(Observed) 13151
    Percent Possible(Observed) 99.8
    R Merge I(Observed) 0.087
    B(Isotropic) From Wilson Plot 53.39
    Redundancy 9.8
     
    High Resolution Shell Details
    Resolution(High) 2.75
    Resolution(Low) 2.8
    Percent Possible(All) 64.7
    R Merge I(Observed) 0.522
    Mean I Over Sigma(Observed) 1.55
    Redundancy 9.7
    Number Unique Reflections(All) 647
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method FOURIER SYNTHESIS
    reflnsShellList 2.75
    Resolution(Low) 24.042
    Cut-off Sigma(I) 0.0
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 13151
    Number of Reflections(Observed) 13149
    Number of Reflections(R-Free) 1331
    Percent Reflections(Observed) 99.93
    R-Factor(Observed) 0.1977
    R-Work 0.1893
    R-Free 0.2713
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model RESTRAINED
    Mean Isotropic B Value 49.4288
    Anisotropic B[1][1] 0.8429
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.8429
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.6859
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7503
    Shell Resolution(Low) 2.8484
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 1170
    R-Factor(R-Work) 0.2876
    R-Factor(R-Free) 0.3743
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8484
    Shell Resolution(Low) 2.9623
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 1179
    R-Factor(R-Work) 0.2694
    R-Factor(R-Free) 0.3633
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9623
    Shell Resolution(Low) 3.0968
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 1169
    R-Factor(R-Work) 0.2319
    R-Factor(R-Free) 0.3356
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0968
    Shell Resolution(Low) 3.2597
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 1170
    R-Factor(R-Work) 0.2201
    R-Factor(R-Free) 0.3448
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2597
    Shell Resolution(Low) 3.4634
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 1165
    R-Factor(R-Work) 0.2165
    R-Factor(R-Free) 0.2907
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4634
    Shell Resolution(Low) 3.7299
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 1186
    R-Factor(R-Work) 0.1953
    R-Factor(R-Free) 0.2883
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7299
    Shell Resolution(Low) 4.1036
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 1189
    R-Factor(R-Work) 0.1765
    R-Factor(R-Free) 0.2679
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1036
    Shell Resolution(Low) 4.6936
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1180
    R-Factor(R-Work) 0.1436
    R-Factor(R-Free) 0.222
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6936
    Shell Resolution(Low) 5.8989
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 1183
    R-Factor(R-Work) 0.1723
    R-Factor(R-Free) 0.2252
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8989
    Shell Resolution(Low) 24.0431
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1227
    R-Factor(R-Work) 0.1689
    R-Factor(R-Free) 0.2451
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 18.434
    f_plane_restr 0.004
    f_chiral_restr 0.074
    f_angle_d 1.188
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3227
    Nucleic Acid Atoms 0
    Heterogen Atoms 66
    Solvent Atoms 34
     
     
  •   Software and Computing Hide
    Computing
    Data Collection StructureStudio
    Data Reduction (intensity integration) HKL
    Data Reduction (data scaling) HKL
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    data reduction HKL