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X-RAY DIFFRACTION
Materials and Methods page
4I43
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.9
    Temperature 293.0
    Details 7-9% PEG8000 0.1M sodium citrate 0.05-0.15M ammonium sulfate , pH 7.9, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 118.86 α = 90
    b = 158.6 β = 90
    c = 220.51 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2012-06-27
     
    Diffraction Radiation
    Monochromator SILICON (111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-1
    Wavelength 0.91
    Site ESRF
    Beamline ID23-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 1.5
    Resolution(High) 2
    Resolution(Low) 48.3
    Number Reflections(Observed) 139972
    Percent Possible(Observed) 99.9
     
    High Resolution Shell Details
    Resolution(High) 2.0
    Resolution(Low) 2.05
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.0126
    Mean I Over Sigma(Observed) 1.5
    Redundancy 5.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.0
    Resolution(Low) 48.3
    Number of Reflections(all) 140035
    Number of Reflections(Observed) 139972
    Number of Reflections(R-Free) 7046
    Percent Reflections(Observed) 100.0
    R-Factor(Observed) 0.201
    R-Work 0.198
    R-Free 0.249
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 51.52
    Anisotropic B[1][1] -1.33
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 2.0
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.66
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0
    Shell Resolution(Low) 2.05
    Number of Reflections(R-Free) 514
    Number of Reflections(R-Work) 9770
    R-Factor(R-Work) 0.294
    R-Factor(R-Free) 0.328
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_gen_planes_other 0.001
    r_gen_planes_refined 0.011
    r_chiral_restr 0.065
    r_dihedral_angle_4_deg 19.33
    r_dihedral_angle_3_deg 16.103
    r_dihedral_angle_2_deg 37.158
    r_dihedral_angle_1_deg 7.761
    r_angle_other_deg 0.576
    r_angle_refined_deg 0.947
    r_bond_other_d 0.001
    r_bond_refined_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 14232
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 670
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) AIMLESS
    Structure Solution MOLREP, PHASER, SHELXE
    Structure Refinement REFMAC 5.7.0032
     
    Software
    refinement REFMAC version: 5.7.0032
    model building Shelxe
    model building Phaser
    model building Molrep
    data collection mxCube