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X-RAY DIFFRACTION
Materials and Methods page
4I3Z
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 293.15
    Details 22% w/v polyacrylic acid sodium salt 5100, 20mM MgCl2, 100mM HEPES pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 293.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 70.77 α = 90
    b = 164.13 β = 107.07
    c = 73.28 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2010-03-22
     
    Diffraction Radiation
    Monochromator DIAMOND LAUE
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 21-ID-F
    Wavelength List 0.97872
    Site APS
    Beamline 21-ID-F
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 1.5
    Resolution(High) 2.05
    Resolution(Low) 43.12
    Number Reflections(Observed) 98449
    Percent Possible(Observed) 98.6
     
    High Resolution Shell Details
    Resolution(High) 2.05
    Resolution(Low) 2.16
    Percent Possible(All) 97.3
    Mean I Over Sigma(Observed) 1.6
    R-Sym I(Observed) 0.857
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.05
    Resolution(Low) 42.79
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 98385
    Number of Reflections(Observed) 98383
    Number of Reflections(R-Free) 4895
    Percent Reflections(Observed) 98.55
    R-Factor(Observed) 0.1989
    R-Work 0.1974
    R-Free 0.2278
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 12.1911
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 7.7294
    Anisotropic B[2][2] -7.8862
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -4.3049
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.05
    Shell Resolution(Low) 2.0733
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 3092
    R-Factor(R-Work) 0.3341
    R-Factor(R-Free) 0.3578
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0733
    Shell Resolution(Low) 2.0977
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 3080
    R-Factor(R-Work) 0.3151
    R-Factor(R-Free) 0.3312
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0977
    Shell Resolution(Low) 2.1233
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3039
    R-Factor(R-Work) 0.2998
    R-Factor(R-Free) 0.2937
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1233
    Shell Resolution(Low) 2.1502
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 3099
    R-Factor(R-Work) 0.2899
    R-Factor(R-Free) 0.3113
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1502
    Shell Resolution(Low) 2.1784
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 3020
    R-Factor(R-Work) 0.2713
    R-Factor(R-Free) 0.2985
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1784
    Shell Resolution(Low) 2.2083
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 3082
    R-Factor(R-Work) 0.2759
    R-Factor(R-Free) 0.2935
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2083
    Shell Resolution(Low) 2.2398
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 3067
    R-Factor(R-Work) 0.2681
    R-Factor(R-Free) 0.3015
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2398
    Shell Resolution(Low) 2.2733
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 3065
    R-Factor(R-Work) 0.2533
    R-Factor(R-Free) 0.2824
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2733
    Shell Resolution(Low) 2.3088
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 3042
    R-Factor(R-Work) 0.245
    R-Factor(R-Free) 0.2874
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3088
    Shell Resolution(Low) 2.3466
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 3030
    R-Factor(R-Work) 0.2288
    R-Factor(R-Free) 0.258
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3466
    Shell Resolution(Low) 2.3871
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3084
    R-Factor(R-Work) 0.2251
    R-Factor(R-Free) 0.2773
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3871
    Shell Resolution(Low) 2.4305
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 3054
    R-Factor(R-Work) 0.2171
    R-Factor(R-Free) 0.2514
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4305
    Shell Resolution(Low) 2.4772
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 3050
    R-Factor(R-Work) 0.2236
    R-Factor(R-Free) 0.29
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4772
    Shell Resolution(Low) 2.5278
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 3128
    R-Factor(R-Work) 0.2149
    R-Factor(R-Free) 0.2758
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5278
    Shell Resolution(Low) 2.5828
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 3116
    R-Factor(R-Work) 0.2021
    R-Factor(R-Free) 0.231
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5828
    Shell Resolution(Low) 2.6428
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 3156
    R-Factor(R-Work) 0.2014
    R-Factor(R-Free) 0.2556
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6428
    Shell Resolution(Low) 2.7089
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 3133
    R-Factor(R-Work) 0.1904
    R-Factor(R-Free) 0.2258
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7089
    Shell Resolution(Low) 2.7821
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 3114
    R-Factor(R-Work) 0.1783
    R-Factor(R-Free) 0.228
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7821
    Shell Resolution(Low) 2.864
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 3170
    R-Factor(R-Work) 0.1765
    R-Factor(R-Free) 0.2226
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.864
    Shell Resolution(Low) 2.9564
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 3176
    R-Factor(R-Work) 0.1765
    R-Factor(R-Free) 0.2071
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9564
    Shell Resolution(Low) 3.062
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 3161
    R-Factor(R-Work) 0.174
    R-Factor(R-Free) 0.1978
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.062
    Shell Resolution(Low) 3.1846
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 3127
    R-Factor(R-Work) 0.1728
    R-Factor(R-Free) 0.2188
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1846
    Shell Resolution(Low) 3.3295
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 3146
    R-Factor(R-Work) 0.1748
    R-Factor(R-Free) 0.2387
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3295
    Shell Resolution(Low) 3.5049
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 3158
    R-Factor(R-Work) 0.1631
    R-Factor(R-Free) 0.2002
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5049
    Shell Resolution(Low) 3.7244
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 3179
    R-Factor(R-Work) 0.1686
    R-Factor(R-Free) 0.1852
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7244
    Shell Resolution(Low) 4.0118
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 3185
    R-Factor(R-Work) 0.1681
    R-Factor(R-Free) 0.1921
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0118
    Shell Resolution(Low) 4.4152
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 3174
    R-Factor(R-Work) 0.1654
    R-Factor(R-Free) 0.1833
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4152
    Shell Resolution(Low) 5.0532
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 3188
    R-Factor(R-Work) 0.1632
    R-Factor(R-Free) 0.1824
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0532
    Shell Resolution(Low) 6.3631
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 3183
    R-Factor(R-Work) 0.2005
    R-Factor(R-Free) 0.2193
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.3631
    Shell Resolution(Low) 42.7995
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 3190
    R-Factor(R-Work) 0.2068
    R-Factor(R-Free) 0.2222
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.061
    f_dihedral_angle_d 14.949
    f_angle_d 0.887
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8902
    Nucleic Acid Atoms 0
    Heterogen Atoms 114
    Solvent Atoms 521
     
     
  •   Software and Computing Hide
    Computing
    Data Collection marccd
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building PHASER
    data collection marccd