X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 5.5
Temperature 293.0
Details 10% peg400, 20% peg8000, 100 mM Na-acetate pH5.5, 500 mM NaCl, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 158.91 α = 90
b = 158.91 β = 90
c = 80.27 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2011-06-20
Diffraction Radiation
Monochromator Protocol
SI 111 CHANNEL SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID -- APS 22-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3 50 97.2 0.146 0.146 -- 6.0 -- 22975 -- 2.0 75.0
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.0 3.11 88.3 -- -- 2.61 3.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.0 43.65 -- 1.34 -- 22971 1380 97.2 -- 0.186 0.183 0.245 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.001 3.1082 -- 131 1985 0.3099 0.3564 -- 91.0
X Ray Diffraction 3.1082 3.2327 -- 158 2143 0.2958 0.3998 -- 98.0
X Ray Diffraction 3.2327 3.3797 -- 141 2162 0.2604 0.3085 -- 99.0
X Ray Diffraction 3.3797 3.5578 -- 135 2157 0.2273 0.3187 -- 99.0
X Ray Diffraction 3.5578 3.7806 -- 146 2188 0.1986 0.2865 -- 99.0
X Ray Diffraction 3.7806 4.0723 -- 134 2151 0.175 0.2393 -- 98.0
X Ray Diffraction 4.0723 4.4818 -- 132 2178 0.1389 0.1784 -- 98.0
X Ray Diffraction 4.4818 5.1294 -- 158 2175 0.1306 0.187 -- 98.0
X Ray Diffraction 5.1294 6.4592 -- 132 2189 0.1724 0.2076 -- 98.0
X Ray Diffraction 6.4592 43.6564 -- 113 2263 0.1793 0.2598 -- 96.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_chiral_restr 0.083
f_dihedral_angle_d 17.339
f_angle_d 1.299
f_bond_d 0.009
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4806
Nucleic Acid Atoms 0
Heterogen Atoms 53
Solvent Atoms 4

Software

Computing
Computing Package Purpose
XDS Data Reduction (intensity integration)
XDS Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (PHENIX.REFINE: 1.8.1_1168) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8.1_1168) refinement
phaser model building
XDS data collection