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X-RAY DIFFRACTION
Materials and Methods page
4I3R
  •   Crystallization Hide
    Crystallization Experiments
    pH 5.5
    Temperature 293.0
    Details 10% peg400, 20% peg8000, 100 mM Na-acetate pH5.5, 500 mM NaCl, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 158.91 α = 90
    b = 158.91 β = 90
    c = 80.27 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2011-06-20
     
    Diffraction Radiation
    Monochromator SI 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength 1
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 3
    Resolution(Low) 50
    Number Reflections(Observed) 22975
    Percent Possible(Observed) 97.2
    R Merge I(Observed) 0.146
    B(Isotropic) From Wilson Plot 75.0
    Redundancy 6.0
     
    High Resolution Shell Details
    Resolution(High) 3.0
    Resolution(Low) 3.11
    Percent Possible(All) 88.3
    Mean I Over Sigma(Observed) 2.61
    Redundancy 3.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.0
    Resolution(Low) 43.65
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 22971
    Number of Reflections(R-Free) 1380
    Percent Reflections(Observed) 97.2
    R-Factor(Observed) 0.186
    R-Work 0.183
    R-Free 0.245
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.001
    Shell Resolution(Low) 3.1082
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 1985
    R-Factor(R-Work) 0.3099
    R-Factor(R-Free) 0.3564
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1082
    Shell Resolution(Low) 3.2327
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2143
    R-Factor(R-Work) 0.2958
    R-Factor(R-Free) 0.3998
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2327
    Shell Resolution(Low) 3.3797
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2162
    R-Factor(R-Work) 0.2604
    R-Factor(R-Free) 0.3085
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3797
    Shell Resolution(Low) 3.5578
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2157
    R-Factor(R-Work) 0.2273
    R-Factor(R-Free) 0.3187
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5578
    Shell Resolution(Low) 3.7806
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2188
    R-Factor(R-Work) 0.1986
    R-Factor(R-Free) 0.2865
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7806
    Shell Resolution(Low) 4.0723
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2151
    R-Factor(R-Work) 0.175
    R-Factor(R-Free) 0.2393
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0723
    Shell Resolution(Low) 4.4818
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2178
    R-Factor(R-Work) 0.1389
    R-Factor(R-Free) 0.1784
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4818
    Shell Resolution(Low) 5.1294
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2175
    R-Factor(R-Work) 0.1306
    R-Factor(R-Free) 0.187
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1294
    Shell Resolution(Low) 6.4592
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2189
    R-Factor(R-Work) 0.1724
    R-Factor(R-Free) 0.2076
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.4592
    Shell Resolution(Low) 43.6564
    Number of Reflections(R-Free) 113
    Number of Reflections(R-Work) 2263
    R-Factor(R-Work) 0.1793
    R-Factor(R-Free) 0.2598
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.083
    f_dihedral_angle_d 17.339
    f_angle_d 1.299
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4806
    Nucleic Acid Atoms 0
    Heterogen Atoms 53
    Solvent Atoms 4
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building phaser
    data collection XDS