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X-RAY DIFFRACTION
Materials and Methods page
4I3H
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 5
    Temperature 296.0
    Details 4% isopropanol, 50 mM sodium citrate, 600 nL + 400 nL (protein + precipitant) drop ratio, VAPOR DIFFUSION, SITTING DROP, temperature 296K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 160.6 α = 90
    b = 160.6 β = 90
    c = 280.56 γ = 90
     
    Space Group
    Space Group Name:    P 42 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type DECTRIS PILATUS 2M
    Collection Date 2012-07-23
     
    Diffraction Radiation
    Monochromator Single bounce monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I04-1
    Wavelength List 0.92000
    Site DIAMOND
    Beamline I04-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -1.0
    Observed Criterion Sigma(I) -1.0
    Resolution(High) 3.7
    Resolution(Low) 72.19
    Number Reflections(All) 39884
    Number Reflections(Observed) 39884
    Percent Possible(Observed) 99.75
    R Merge I(Observed) 0.124
    Redundancy 12.11
     
    High Resolution Shell Details
    Resolution(High) 3.7
    Resolution(Low) 3.9
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.45
    Mean I Over Sigma(Observed) 1.71
    Redundancy 11.46
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.7
    Resolution(Low) 71.823
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 39884
    Number of Reflections(Observed) 39825
    Number of Reflections(R-Free) 2006
    Percent Reflections(Observed) 99.69
    R-Factor(Observed) 0.1886
    R-Work 0.1855
    R-Free 0.2485
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 7.8718
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 7.8718
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -12.19
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7
    Shell Resolution(Low) 3.7925
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2649
    R-Factor(R-Work) 0.1818
    R-Factor(R-Free) 0.242
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7925
    Shell Resolution(Low) 3.8951
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2672
    R-Factor(R-Work) 0.1791
    R-Factor(R-Free) 0.2446
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8951
    Shell Resolution(Low) 4.0097
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2636
    R-Factor(R-Work) 0.168
    R-Factor(R-Free) 0.238
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0097
    Shell Resolution(Low) 4.1391
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2683
    R-Factor(R-Work) 0.1635
    R-Factor(R-Free) 0.2386
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1391
    Shell Resolution(Low) 4.287
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2655
    R-Factor(R-Work) 0.1559
    R-Factor(R-Free) 0.2329
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.287
    Shell Resolution(Low) 4.4586
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2681
    R-Factor(R-Work) 0.1468
    R-Factor(R-Free) 0.2442
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4586
    Shell Resolution(Low) 4.6615
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2670
    R-Factor(R-Work) 0.1398
    R-Factor(R-Free) 0.1923
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6615
    Shell Resolution(Low) 4.9072
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2689
    R-Factor(R-Work) 0.1468
    R-Factor(R-Free) 0.2478
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9072
    Shell Resolution(Low) 5.2146
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2642
    R-Factor(R-Work) 0.164
    R-Factor(R-Free) 0.2114
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2146
    Shell Resolution(Low) 5.6171
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2688
    R-Factor(R-Work) 0.1773
    R-Factor(R-Free) 0.269
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6171
    Shell Resolution(Low) 6.1821
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2730
    R-Factor(R-Work) 0.1972
    R-Factor(R-Free) 0.2628
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.1821
    Shell Resolution(Low) 7.0759
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2738
    R-Factor(R-Work) 0.1957
    R-Factor(R-Free) 0.2841
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.0759
    Shell Resolution(Low) 8.9123
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2792
    R-Factor(R-Work) 0.1823
    R-Factor(R-Free) 0.2452
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.9123
    Shell Resolution(Low) 71.8361
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2894
    R-Factor(R-Work) 0.255
    R-Factor(R-Free) 0.2729
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.087
    f_dihedral_angle_d 18.903
    f_angle_d 1.396
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 14849
    Nucleic Acid Atoms 1374
    Heterogen Atoms 3
    Solvent Atoms 2
     
     
  •   Software and Computing Hide
    Computing
    Data Collection GDE
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    model building Phaser
    data collection GDE