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X-RAY DIFFRACTION
Materials and Methods page
4I2Q
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 162.6 α = 90
    b = 72.95 β = 100.7
    c = 108.54 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Collection Date 2010-07-13
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CHESS BEAMLINE F1
    Site CHESS
    Beamline F1
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.7
    Resolution(Low) 43.01
    Number Reflections(Observed) 34228
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.7004
    Resolution(Low) 43.015
    Cut-off Sigma(F) 1.36
    Number of Reflections(Observed) 34220
    Number of Reflections(R-Free) 2000
    Percent Reflections(Observed) 99.04
    R-Factor(Observed) 0.2146
    R-Work 0.2107
    R-Free 0.2768
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -4.5073
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -8.7187
    Anisotropic B[2][2] -4.0151
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 12.9243
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7004
    Shell Resolution(Low) 2.7679
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2040
    R-Factor(R-Work) 0.3401
    R-Factor(R-Free) 0.4231
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7679
    Shell Resolution(Low) 2.8428
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2277
    R-Factor(R-Work) 0.314
    R-Factor(R-Free) 0.4297
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8428
    Shell Resolution(Low) 2.9264
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2295
    R-Factor(R-Work) 0.2969
    R-Factor(R-Free) 0.3674
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9264
    Shell Resolution(Low) 3.0208
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2310
    R-Factor(R-Work) 0.2603
    R-Factor(R-Free) 0.3783
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0208
    Shell Resolution(Low) 3.1288
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2288
    R-Factor(R-Work) 0.2422
    R-Factor(R-Free) 0.3079
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1288
    Shell Resolution(Low) 3.254
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2307
    R-Factor(R-Work) 0.223
    R-Factor(R-Free) 0.2888
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.254
    Shell Resolution(Low) 3.402
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2313
    R-Factor(R-Work) 0.2241
    R-Factor(R-Free) 0.3205
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.402
    Shell Resolution(Low) 3.5813
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2331
    R-Factor(R-Work) 0.2256
    R-Factor(R-Free) 0.3124
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5813
    Shell Resolution(Low) 3.8056
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2305
    R-Factor(R-Work) 0.2134
    R-Factor(R-Free) 0.2775
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8056
    Shell Resolution(Low) 4.0992
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2328
    R-Factor(R-Work) 0.1937
    R-Factor(R-Free) 0.3
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0992
    Shell Resolution(Low) 4.5113
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2332
    R-Factor(R-Work) 0.168
    R-Factor(R-Free) 0.227
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5113
    Shell Resolution(Low) 5.1632
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2331
    R-Factor(R-Work) 0.167
    R-Factor(R-Free) 0.2348
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1632
    Shell Resolution(Low) 6.5014
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2354
    R-Factor(R-Work) 0.2106
    R-Factor(R-Free) 0.255
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.5014
    Shell Resolution(Low) 43.0205
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2409
    R-Factor(R-Work) 0.1907
    R-Factor(R-Free) 0.2057
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.078
    f_dihedral_angle_d 17.467
    f_angle_d 1.263
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7948
    Nucleic Acid Atoms 0
    Heterogen Atoms 36
    Solvent Atoms 134
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.refine: 1.7.1_743)
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHENIX version: (phenix.refine: 1.7.1_743)
    data collection HKL-2000