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X-RAY DIFFRACTION
Materials and Methods page
4I1S
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 298.0
    Details 100mM HEPES pH7.5 18% (w/v) PEG1500 trace amounts of trypsin , VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 51.07 α = 90
    b = 52.49 β = 90
    c = 120.79 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2012-05-21
     
    Diffraction Radiation
    Monochromator Si 111 channel-cut
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-1
    Wavelength List 0.9792
    Site ESRF
    Beamline ID23-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.29
    Resolution(Low) 50
    Number Reflections(All) 27871
    Percent Possible(Observed) 99.2
    B(Isotropic) From Wilson Plot 39.03
    Redundancy 7.17
     
    High Resolution Shell Details
    Resolution(High) 2.29
    Resolution(Low) 2.35
    Percent Possible(All) 83.8
    Mean I Over Sigma(Observed) 2.58
    R-Sym I(Observed) 0.838
    Redundancy 6.77
    Number Unique Reflections(All) 1874
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.293
    Resolution(Low) 48.141
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 27871
    Number of Reflections(Observed) 27856
    Number of Reflections(R-Free) 1427
    Percent Reflections(Observed) 99.18
    R-Factor(All) 0.1817
    R-Factor(Observed) 0.1817
    R-Work 0.1792
    R-Free 0.2296
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2933
    Shell Resolution(Low) 2.3753
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2467
    R-Factor(R-Work) 0.2226
    R-Factor(R-Free) 0.2425
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3753
    Shell Resolution(Low) 2.4704
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2673
    R-Factor(R-Work) 0.2261
    R-Factor(R-Free) 0.3108
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4704
    Shell Resolution(Low) 2.5828
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 2624
    R-Factor(R-Work) 0.2123
    R-Factor(R-Free) 0.2963
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5828
    Shell Resolution(Low) 2.719
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 2662
    R-Factor(R-Work) 0.2192
    R-Factor(R-Free) 0.2897
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.719
    Shell Resolution(Low) 2.8893
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2638
    R-Factor(R-Work) 0.2074
    R-Factor(R-Free) 0.2581
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8893
    Shell Resolution(Low) 3.1124
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2648
    R-Factor(R-Work) 0.1917
    R-Factor(R-Free) 0.2383
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1124
    Shell Resolution(Low) 3.4255
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2694
    R-Factor(R-Work) 0.1706
    R-Factor(R-Free) 0.2035
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4255
    Shell Resolution(Low) 3.921
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2656
    R-Factor(R-Work) 0.1477
    R-Factor(R-Free) 0.2026
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.921
    Shell Resolution(Low) 4.9393
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2668
    R-Factor(R-Work) 0.1337
    R-Factor(R-Free) 0.182
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9393
    Shell Resolution(Low) 48.1516
    Number of Reflections(R-Free) 100
    Number of Reflections(R-Work) 2699
    R-Factor(R-Work) 0.1986
    R-Factor(R-Free) 0.2299
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.077
    f_dihedral_angle_d 16.027
    f_angle_d 1.173
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2359
    Nucleic Acid Atoms 0
    Heterogen Atoms 2
    Solvent Atoms 110
     
     
  •   Software and Computing Hide
    Computing
    Data Collection DNA
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution SHARP
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building SHARP
    data collection DNA