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X-RAY DIFFRACTION
Materials and Methods page
4I19
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7
    Temperature 289.0
    Details 1.4M Sodium Malonate, 0.1M Bis-Tris Propane:NaOH, pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 76.01 α = 90
    b = 76.01 β = 90
    c = 161.26 γ = 90
     
    Space Group
    Space Group Name:    P 41 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirror
    Collection Date 2012-04-16
     
    Diffraction Radiation
    Monochromator Si 111 Crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97915
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.15
    Resolution(Low) 33.5
    Number Reflections(All) 26537
    Number Reflections(Observed) 26537
    Percent Possible(Observed) 99.8
    R Merge I(Observed) 0.122
    Redundancy 9.2
     
    High Resolution Shell Details
    Resolution(High) 2.15
    Resolution(Low) 2.19
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.604
    Mean I Over Sigma(Observed) 4.6
    Redundancy 9.3
    Number Unique Reflections(All) 1275
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.148
    Resolution(Low) 33.262
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 26457
    Number of Reflections(Observed) 26457
    Number of Reflections(R-Free) 1335
    Percent Reflections(Observed) 99.56
    R-Factor(All) 0.1648
    R-Factor(Observed) 0.1648
    R-Work 0.1624
    R-Free 0.2087
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -7.7538
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -7.7538
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 15.5075
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1482
    Shell Resolution(Low) 2.225
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2403
    R-Factor(R-Work) 0.1889
    R-Factor(R-Free) 0.2325
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.225
    Shell Resolution(Low) 2.3141
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2457
    R-Factor(R-Work) 0.1881
    R-Factor(R-Free) 0.2747
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3141
    Shell Resolution(Low) 2.4194
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2473
    R-Factor(R-Work) 0.1714
    R-Factor(R-Free) 0.2363
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4194
    Shell Resolution(Low) 2.5469
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2519
    R-Factor(R-Work) 0.1744
    R-Factor(R-Free) 0.2105
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5469
    Shell Resolution(Low) 2.7064
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2475
    R-Factor(R-Work) 0.1807
    R-Factor(R-Free) 0.2369
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7064
    Shell Resolution(Low) 2.9152
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2499
    R-Factor(R-Work) 0.1933
    R-Factor(R-Free) 0.3006
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9152
    Shell Resolution(Low) 3.2084
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2487
    R-Factor(R-Work) 0.1936
    R-Factor(R-Free) 0.2613
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2084
    Shell Resolution(Low) 3.6721
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2508
    R-Factor(R-Work) 0.1622
    R-Factor(R-Free) 0.2131
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6721
    Shell Resolution(Low) 4.6245
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2566
    R-Factor(R-Work) 0.1263
    R-Factor(R-Free) 0.1459
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6245
    Shell Resolution(Low) 33.2662
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2735
    R-Factor(R-Work) 0.1522
    R-Factor(R-Free) 0.1749
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.066
    f_dihedral_angle_d 13.685
    f_angle_d 1.04
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3027
    Nucleic Acid Atoms 0
    Heterogen Atoms 38
    Solvent Atoms 191
     
     
  •   Software and Computing Hide
    Computing
    Data Collection sbc-collect
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution SHELXD/MLPHARE/DM/ARP/wARP/HKL3000
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building SHELXD/MLPHARE/DM/ARP/wARP/HKL3000
    data collection sbc-collect