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X-RAY DIFFRACTION
Materials and Methods page
4HZS
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.6
    Temperature 286.0
    Details 0.2 M ammonium sulfate, 0.1 M Bis-Tris, pH 6.6, 22-24% PEG3350, 10-20 mM TCEP, VAPOR DIFFUSION, HANGING DROP, temperature 286K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 145.46 α = 90
    b = 145.46 β = 90
    c = 103.75 γ = 90
     
    Space Group
    Space Group Name:    P 4
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 98
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Details Mirrors
    Collection Date 2010-03-08
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 17-ID
    Wavelength List 1.0
    Site APS
    Beamline 17-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 3.23
    Resolution(Low) 73.04
    Number Reflections(All) 34878
    Number Reflections(Observed) 34878
    Percent Possible(Observed) 99.5
    R Merge I(Observed) 0.187
    Redundancy 6.5
     
    High Resolution Shell Details
    Resolution(High) 3.23
    Resolution(Low) 3.4
    Percent Possible(All) 96.7
    R Merge I(Observed) 0.477
    Mean I Over Sigma(Observed) 2.0
    Redundancy 3.1
    Number Unique Reflections(All) 4895
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.23
    Resolution(Low) 73.04
    Cut-off Sigma(I) 0.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 34753
    Number of Reflections(Observed) 34753
    Number of Reflections(R-Free) 1717
    Percent Reflections(Observed) 99.5
    R-Factor(All) 0.247
    R-Factor(Observed) 0.247
    R-Work 0.246
    R-Free 0.27
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model RESTRAINED
    Mean Isotropic B Value 26.3
    Anisotropic B[1][1] 3.69
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 3.69
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -7.37
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.23
    Shell Resolution(Low) 3.43
    Number of Reflections(R-Free) 259
    Number of Reflections(R-Work) 5388
    R-Factor(R-Work) 0.326
    R-Factor(R-Free) 0.351
    R-Free Error 0.022
    Percent Reflections(Observed) 97.1
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_scangle_it 2.87
    c_scbond_it 1.72
    c_mcangle_it 2.39
    c_mcbond_it 1.32
    c_improper_angle_d 0.67
    c_dihedral_angle_d 23.0
    c_angle_deg 1.1
    c_bond_d 0.009
     
    Coordinate Error
    Luzzati ESD(Observed) 0.38
    Luzzati Sigma A(Observed) 0.52
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.42
    Luzzati Sigma A(R-Free Set) 0.47
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 10196
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection JDIRECTOR
    Data Reduction (intensity integration) AUTOPROC
    Data Reduction (data scaling) SCALA
    Structure Solution CNX
    Structure Refinement CNX 2005
     
    Software
    refinement CNX version: 2005
    model building CNX
    data collection JDIRECTOR