X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 4
Temperature 277.0
Details 2.40M ammonium sulfate, 0.1M citric acid pH 4.0, NANODROP, VAPOR DIFFUSION, SITTING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 66.29 α = 90
b = 66.29 β = 90
c = 253.83 γ = 120
Symmetry
Space Group P 65 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS 6M Flat mirror (vertical focusing); single crystal Si(111) bent monochromator (horizontal focusing) 2012-06-28
Diffraction Radiation
Monochromator Protocol
single crystal Si(111) bent MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL11-1 0.97871,0.97922,0.91837 SSRL BL11-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.25 29.38 99.9 -- 0.103 -- 11.1 16696 16696 -- -- 43.423
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.25 2.31 100.0 0.873 0.873 0.9 10.0 1191

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 2.25 29.377 -- 0.0 -- 16601 842 99.96 -- 0.1876 0.1865 0.2084 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.25 2.4 -- 152 2757 0.1977 0.2277 -- 99.96
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 51.5237
Anisotropic B[1][1] -1.618
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -1.618
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 3.236
RMS Deviations
Key Refinement Restraint Deviation
t_omega_torsion 3.74
t_angle_deg 1.06
t_bond_d 0.01
t_other_torsion 2.8
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.315
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1822
Nucleic Acid Atoms 0
Heterogen Atoms 84
Solvent Atoms 107

Software

Software
Software Name Purpose
MOLPROBITY validation version: 3beta29
PDB_EXTRACT data extraction version: 3.10
SHELX phasing
SHARP phasing
SCALA data scaling version: 3.3.20
BUSTER-TNT refinement version: 2.10.0
MOSFLM data reduction
SHELXD phasing
BUSTER refinement version: 2.10.0