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X-RAY DIFFRACTION
Materials and Methods page
4HY7
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 291.0
    Details 20% PEG 8000, 0.1M HEPES pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 37.91 α = 90
    b = 49.85 β = 90
    c = 78.98 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 197
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Collection Date 2012-10-31
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Wavelength List 0.9733
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.2
    Resolution(Low) 50
    Number Reflections(All) 47120
    Number Reflections(Observed) 47120
    Percent Possible(Observed) 99.0
     
    High Resolution Shell Details
    Resolution(High) 1.2
    Resolution(Low) 1.22
    Percent Possible(All) 99.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.2
    Resolution(Low) 27.35
    Number of Reflections(Observed) 44680
    Number of Reflections(R-Free) 1982
    Percent Reflections(Observed) 97.96
    R-Factor(Observed) 0.18732
    R-Work 0.18655
    R-Free 0.20439
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 11.143
    Anisotropic B[1][1] -0.31
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.4
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.71
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2
    Shell Resolution(Low) 1.231
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2908
    R-Factor(R-Work) 0.23
    R-Factor(R-Free) 0.237
    Percent Reflections(Observed) 92.86
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_gen_planes_refined 0.015
    r_chiral_restr 0.368
    r_dihedral_angle_4_deg 20.836
    r_dihedral_angle_3_deg 11.965
    r_dihedral_angle_2_deg 34.476
    r_dihedral_angle_1_deg 6.835
    r_angle_refined_deg 2.305
    r_bond_refined_d 0.027
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1365
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 158
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement REFMAC 5.6.0117
     
    Software
    refinement REFMAC version: 5.6.0117
    model building PHENIX
    data collection HKL-2000