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X-RAY DIFFRACTION
Materials and Methods page
4HY4
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8.5
    Temperature 295.0
    Details 3M NaCl,100mM Tris, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 30.65 α = 90
    b = 68.59 β = 90
    c = 117.59 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2009-05-28
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 5.0.3
    Wavelength List 0.976
    Site ALS
    Beamline 5.0.3
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.25
    Resolution(Low) 50
    Number Reflections(All) 69825
    Number Reflections(Observed) 69825
    Percent Possible(Observed) 99.5
     
    High Resolution Shell Details
    Resolution(High) 1.249
    Resolution(Low) 1.27
    Percent Possible(All) 92.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.249
    Resolution(Low) 20.0
    Number of Reflections(Observed) 65816
    Number of Reflections(R-Free) 3498
    Percent Reflections(Observed) 99.33
    R-Factor(Observed) 0.15329
    R-Work 0.15239
    R-Free 0.16993
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 17.593
    Anisotropic B[1][1] -0.33
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.28
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.61
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.249
    Shell Resolution(Low) 1.282
    Number of Reflections(R-Free) 226
    Number of Reflections(R-Work) 4517
    R-Factor(R-Work) 0.219
    R-Factor(R-Free) 0.227
    Percent Reflections(Observed) 92.87
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 2.585
    r_scbond_it 1.741
    r_mcangle_it 1.777
    r_mcbond_other 0.288
    r_mcbond_it 1.135
    r_nbd_refined 0.234
    r_gen_planes_other 0.001
    r_gen_planes_refined 0.005
    r_chiral_restr 0.078
    r_dihedral_angle_4_deg 16.782
    r_dihedral_angle_3_deg 12.432
    r_dihedral_angle_2_deg 32.569
    r_dihedral_angle_1_deg 4.2
    r_angle_other_deg 0.841
    r_angle_refined_deg 1.259
    r_bond_other_d 0.001
    r_bond_refined_d 0.008
    r_nbd_other 0.183
    r_nbtor_refined 0.204
    r_nbtor_other 0.084
    r_xyhbond_nbd_refined 0.147
    r_xyhbond_nbd_other 0.185
    r_symmetry_vdw_refined 0.055
    r_symmetry_vdw_other 0.248
    r_symmetry_hbond_refined 0.253
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1526
    Nucleic Acid Atoms 0
    Heterogen Atoms 78
    Solvent Atoms 382
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution molrep
    Structure Refinement REFMAC 5.2.0005
     
    Software
    refinement REFMAC version: 5.2.0005
    model building molrep
    data collection HKL-2000