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X-RAY DIFFRACTION
Materials and Methods page
4HY3
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7
    Temperature 298.0
    Details 30% PEG 6000, 0.1M HEPES, 0.1M MgCl2, pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 61.73 α = 90
    b = 121.12 β = 101.4
    c = 106.65 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Details MIRRORS
    Collection Date 2012-10-16
     
    Diffraction Radiation
    Monochromator Si III
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 0.979
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.8
    Resolution(Low) 104.55
    Number Reflections(All) 37449
    Number Reflections(Observed) 37449
    Percent Possible(Observed) 99.1
    R Merge I(Observed) 0.105
    Redundancy 9.7
     
    High Resolution Shell Details
    Resolution(High) 2.8
    Resolution(Low) 2.8
    Percent Possible(All) 98.7
    R Merge I(Observed) 0.5
    Mean I Over Sigma(Observed) 1.0
    Redundancy 8.8
    Number Unique Reflections(All) 3663
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.8
    Resolution(Low) 104.55
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 35562
    Number of Reflections(Observed) 35562
    Number of Reflections(R-Free) 1865
    Percent Reflections(Observed) 98.9
    R-Factor(Observed) 0.208
    R-Work 0.204
    R-Free 0.291
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 53.009
    Anisotropic B[1][1] 0.22
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 1.33
    Anisotropic B[2][2] 2.33
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.03
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.802
    Shell Resolution(Low) 2.874
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2492
    R-Factor(R-Work) 0.281
    R-Factor(R-Free) 0.404
    Percent Reflections(Observed) 96.31
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_gen_planes_refined 0.007
    r_chiral_restr 0.116
    r_dihedral_angle_4_deg 18.914
    r_dihedral_angle_3_deg 22.52
    r_dihedral_angle_2_deg 36.074
    r_dihedral_angle_1_deg 7.272
    r_angle_refined_deg 1.736
    r_bond_refined_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 9638
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 156
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SHELXD, SHELXE and ARP/wARP
    Structure Refinement REFMAC 5.6.0117
     
    Software
    refinement REFMAC version: 5.6.0117
    model building ARP/wARP
    model building SHELXE
    model building SHELXD
    data collection CBASS