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X-RAY DIFFRACTION
Materials and Methods page
4HWJ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 292.0
    Details 0.1 M Tris pH 7.5-8.5, 25 % w/v PEG 3350, VAPOR DIFFUSION, SITTING DROP, temperature 292K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 63.75 α = 90
    b = 63.75 β = 90
    c = 106.43 γ = 120
     
    Space Group
    Space Group Name:    P 63 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2012-02-18
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type MAX II BEAMLINE I911-3
    Wavelength List 1.8
    Site MAX II
    Beamline I911-3
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.6
    Resolution(Low) 19.9
    Number Reflections(All) 4320
    Number Reflections(Observed) 4320
    Percent Possible(Observed) 99.6
    B(Isotropic) From Wilson Plot 41.1
    Redundancy 21.6
     
    High Resolution Shell Details
    Resolution(High) 2.6
    Resolution(Low) 2.7
    Percent Possible(All) 100.0
    Mean I Over Sigma(Observed) 8.3
    R-Sym I(Observed) 0.0521
    Redundancy 22.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.6
    Resolution(Low) 19.861
    Cut-off Sigma(F) 2.0
    Number of Reflections(all) 4318
    Number of Reflections(Observed) 4318
    Number of Reflections(R-Free) 417
    Percent Reflections(Observed) 99.98
    R-Factor(Observed) 0.2272
    R-Work 0.2228
    R-Free 0.2702
     
    Temperature Factor Modeling
    Mean Isotropic B Value 49.1619
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6004
    Shell Resolution(Low) 2.9756
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 1255
    R-Factor(R-Work) 0.2245
    R-Factor(R-Free) 0.2774
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9756
    Shell Resolution(Low) 3.7448
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 1267
    R-Factor(R-Work) 0.2148
    R-Factor(R-Free) 0.2778
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7448
    Shell Resolution(Low) 19.8615
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1379
    R-Factor(R-Work) 0.2269
    R-Factor(R-Free) 0.2624
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.048
    f_dihedral_angle_d 13.73
    f_angle_d 0.63
    f_bond_d 0.002
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 614
    Nucleic Acid Atoms 0
    Heterogen Atoms 5
    Solvent Atoms 22
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MXcube
    Data Reduction (intensity integration) MXcube
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    molecular replacement Phaser
    data reduction Xscale