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X-RAY DIFFRACTION
Materials and Methods page
4HWA
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.5
    Temperature 277.0
    Details 100 mM Tris HCl pH 8.5, 30% PEG 400, 200 mM MgCl2, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 128.24 α = 90
    b = 149.97 β = 90
    c = 175.78 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Details K-B Focusing Mirrors
    Collection Date 2011-12-14
     
    Diffraction Radiation
    Monochromator Liquid nitrogen-cooled double crystal, Si 111
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL12-2
    Wavelength List 0.97950
    Site SSRL
    Beamline BL12-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 4.37
    Resolution(Low) 46.58
    Number Reflections(All) 22481
    Number Reflections(Observed) 21374
    Percent Possible(Observed) 95.0
     
    High Resolution Shell Details
    Resolution(High) 4.37
    Resolution(Low) 4.48
    Percent Possible(All) 99.8
    R Merge I(Observed) 0.597
    Mean I Over Sigma(Observed) 3.9
    R-Sym I(Observed) 0.597
    Redundancy 6.9
    Number Unique Reflections(All) 1636
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 4.37
    Resolution(Low) 37.914
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 22481
    Number of Reflections(Observed) 21374
    Number of Reflections(R-Free) 1080
    Percent Reflections(Observed) 94.81
    R-Factor(All) 0.268
    R-Factor(Observed) 0.268
    R-Work 0.2669
    R-Free 0.2881
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.37
    Shell Resolution(Low) 4.5686
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2315
    R-Factor(R-Work) 0.2945
    R-Factor(R-Free) 0.3305
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5686
    Shell Resolution(Low) 4.809
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2413
    R-Factor(R-Work) 0.2576
    R-Factor(R-Free) 0.3269
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.809
    Shell Resolution(Low) 5.1097
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2430
    R-Factor(R-Work) 0.232
    R-Factor(R-Free) 0.283
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1097
    Shell Resolution(Low) 5.5031
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2510
    R-Factor(R-Work) 0.239
    R-Factor(R-Free) 0.2607
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5031
    Shell Resolution(Low) 6.0549
    Number of Reflections(R-Free) 104
    Number of Reflections(R-Work) 2547
    R-Factor(R-Work) 0.2517
    R-Factor(R-Free) 0.3058
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.0549
    Shell Resolution(Low) 6.9264
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2597
    R-Factor(R-Work) 0.2569
    R-Factor(R-Free) 0.3059
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.9264
    Shell Resolution(Low) 8.7091
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2701
    R-Factor(R-Work) 0.2468
    R-Factor(R-Free) 0.2445
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.7091
    Shell Resolution(Low) 37.9153
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2781
    R-Factor(R-Work) 0.2878
    R-Factor(R-Free) 0.2954
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.075
    f_dihedral_angle_d 16.465
    f_angle_d 1.111
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 13678
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Bluice
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building Phaser
    data collection Bluice