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X-RAY DIFFRACTION
Materials and Methods page
4HW9
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5
    Temperature 293.0
    Details 100 mM citrate pH 5.0, 200 mM lithium chloride, 28% PEG 400, 5% glycerol, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 113.92 α = 90
    b = 143.1 β = 90
    c = 178.37 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Details K-B Focusing Mirrors
    Collection Date 2008-03-18
     
    Diffraction Radiation
    Monochromator Liquid nitrogen-cooled double crystal, Si 111
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL12-2
    Wavelength List 1.0
    Site SSRL
    Beamline BL12-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 4.14
    Resolution(Low) 46.08
    Number Reflections(All) 22495
    Number Reflections(Observed) 20129
    Percent Possible(Observed) 89.0
     
    High Resolution Shell Details
    Resolution(High) 4.14
    Resolution(Low) 4.25
    Percent Possible(All) 98.4
    R Merge I(Observed) 0.755
    Mean I Over Sigma(Observed) 2.2
    R-Sym I(Observed) 0.755
    Redundancy 3.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 4.14
    Resolution(Low) 44.563
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 22495
    Number of Reflections(Observed) 20129
    Number of Reflections(R-Free) 1036
    Percent Reflections(Observed) 88.23
    R-Factor(Observed) 0.2469
    R-Work 0.2441
    R-Free 0.3044
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1401
    Shell Resolution(Low) 4.3581
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2356
    R-Factor(R-Work) 0.3218
    R-Factor(R-Free) 0.4239
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3581
    Shell Resolution(Low) 4.6309
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2507
    R-Factor(R-Work) 0.2425
    R-Factor(R-Free) 0.3148
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6309
    Shell Resolution(Low) 4.9881
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2579
    R-Factor(R-Work) 0.2018
    R-Factor(R-Free) 0.2975
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9881
    Shell Resolution(Low) 5.4892
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2675
    R-Factor(R-Work) 0.2037
    R-Factor(R-Free) 0.3241
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4892
    Shell Resolution(Low) 6.2816
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2804
    R-Factor(R-Work) 0.2379
    R-Factor(R-Free) 0.3234
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.2816
    Shell Resolution(Low) 7.907
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 3008
    R-Factor(R-Work) 0.2454
    R-Factor(R-Free) 0.3228
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.907
    Shell Resolution(Low) 44.5658
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 3164
    R-Factor(R-Work) 0.2495
    R-Factor(R-Free) 0.2766
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.016
    f_chiral_restr 0.145
    f_dihedral_angle_d 14.866
    f_angle_d 2.766
    f_bond_d 0.023
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 13797
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Bluice
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building Phaser
    data collection Bluice