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X-RAY DIFFRACTION
Materials and Methods page
4HW5
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7
    Temperature 292.0
    Details 2-2.2 M ammonium sulfate with the pH ranging from 6 to 9 , VAPOR DIFFUSION, SITTING DROP, temperature 292K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 63.88 α = 90
    b = 63.88 β = 90
    c = 105.11 γ = 120
     
    Space Group
    Space Group Name:    P 63
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type MAX II BEAMLINE I911-3
    Wavelength List 1.0
    Site MAX II
    Beamline I911-3
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.25
    Resolution(Low) 19.7
    Percent Possible(Observed) 99.8
    B(Isotropic) From Wilson Plot 51.3
    Redundancy 7.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.25
    Resolution(Low) 19.651
    Cut-off Sigma(F) 2.0
    Number of Reflections(all) 10824
    Number of Reflections(Observed) 11568
    Number of Reflections(R-Free) 554
    Percent Reflections(Observed) 99.98
    R-Work 0.2438
    R-Free 0.2427
     
    Temperature Factor Modeling
    Mean Isotropic B Value 66.0916
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.25
    Shell Resolution(Low) 2.4761
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2751
    R-Factor(R-Work) 0.3037
    R-Factor(R-Free) 0.2934
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4761
    Shell Resolution(Low) 2.8335
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2727
    R-Factor(R-Work) 0.2654
    R-Factor(R-Free) 0.2611
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8335
    Shell Resolution(Low) 3.5664
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2756
    R-Factor(R-Work) 0.2328
    R-Factor(R-Free) 0.2549
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5664
    Shell Resolution(Low) 19.6518
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2780
    R-Factor(R-Work) 0.233
    R-Factor(R-Free) 0.2212
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.067
    f_dihedral_angle_d 13.402
    f_angle_d 1.034
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1262
    Nucleic Acid Atoms 0
    Heterogen Atoms 10
    Solvent Atoms 34
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MXcube
    Data Reduction (intensity integration) XSCALE
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    molecular replacement Phaser
    data reduction Xscale