X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5.5
Temperature 298.0
Details 25% PEG3350, 0.2M NaCl, 0.1M Bis-Tris, pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 50.07 α = 90
b = 48.35 β = 93.83
c = 68.18 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MAR scanner 300 mm plate -- 2012-06-19
Diffraction Radiation
Monochromator Protocol
SAGITALLY FOCUSED Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-G 0.97856 APS 21-ID-G

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.53 50 100.0 0.047 0.042 -- -- 49398 49398 1.0 1.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.53 1.56 100.0 0.313 0.408 2.46 3.4 2464

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.53 34.744 -- 1.38 49292 49292 2495 99.92 0.1398 0.1398 0.1374 0.184 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.5298 1.5592 -- 132 2602 0.1942 0.2524 -- 99.0
X Ray Diffraction 1.5592 1.5911 -- 133 2542 0.1694 0.2471 -- 100.0
X Ray Diffraction 1.5911 1.6257 -- 131 2627 0.1527 0.234 -- 100.0
X Ray Diffraction 1.6257 1.6635 -- 135 2597 0.149 0.2328 -- 100.0
X Ray Diffraction 1.6635 1.7051 -- 144 2568 0.1418 0.2038 -- 100.0
X Ray Diffraction 1.7051 1.7512 -- 124 2570 0.1372 0.2051 -- 100.0
X Ray Diffraction 1.7512 1.8027 -- 148 2580 0.1288 0.2188 -- 100.0
X Ray Diffraction 1.8027 1.8609 -- 149 2625 0.1262 0.1954 -- 100.0
X Ray Diffraction 1.8609 1.9274 -- 157 2552 0.1259 0.1949 -- 100.0
X Ray Diffraction 1.9274 2.0045 -- 140 2587 0.1246 0.1833 -- 100.0
X Ray Diffraction 2.0045 2.0958 -- 142 2604 0.1218 0.1893 -- 100.0
X Ray Diffraction 2.0958 2.2062 -- 116 2597 0.1129 0.1888 -- 100.0
X Ray Diffraction 2.2062 2.3444 -- 143 2582 0.1177 0.1754 -- 100.0
X Ray Diffraction 2.3444 2.5254 -- 144 2625 0.1268 0.1754 -- 100.0
X Ray Diffraction 2.5254 2.7794 -- 152 2601 0.1302 0.2016 -- 100.0
X Ray Diffraction 2.7794 3.1814 -- 128 2614 0.14 0.1686 -- 100.0
X Ray Diffraction 3.1814 4.0073 -- 133 2640 0.1304 0.1641 -- 100.0
X Ray Diffraction 4.0073 34.7534 -- 144 2684 0.1659 0.1674 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_chiral_restr 0.053
f_dihedral_angle_d 13.175
f_angle_d 1.005
f_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2627
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 387

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
phaser Structure Solution
PHENIX (phenix.refine: 1.8_1069) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8_1069) refinement
phaser model building
HKL-2000 data collection