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X-RAY DIFFRACTION
Materials and Methods page
4HW4
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.5
    Temperature 298.0
    Details 25% PEG3350, 0.2M NaCl, 0.1M Bis-Tris, pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 50.07 α = 90
    b = 48.35 β = 93.83
    c = 68.18 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR scanner 300 mm plate
    Collection Date 2012-06-19
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 21-ID-G
    Wavelength List 0.97856
    Site APS
    Beamline 21-ID-G
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.53
    Resolution(Low) 50
    Number Reflections(All) 49398
    Number Reflections(Observed) 49398
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.047
     
    High Resolution Shell Details
    Resolution(High) 1.53
    Resolution(Low) 1.56
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.313
    Mean I Over Sigma(Observed) 2.46
    R-Sym I(Observed) 0.408
    Redundancy 3.4
    Number Unique Reflections(All) 2464
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.53
    Resolution(Low) 34.744
    Cut-off Sigma(F) 1.38
    Number of Reflections(all) 49292
    Number of Reflections(Observed) 49292
    Number of Reflections(R-Free) 2495
    Percent Reflections(Observed) 99.92
    R-Factor(All) 0.1398
    R-Factor(Observed) 0.1398
    R-Work 0.1374
    R-Free 0.184
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5298
    Shell Resolution(Low) 1.5592
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2602
    R-Factor(R-Work) 0.1942
    R-Factor(R-Free) 0.2524
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5592
    Shell Resolution(Low) 1.5911
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2542
    R-Factor(R-Work) 0.1694
    R-Factor(R-Free) 0.2471
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5911
    Shell Resolution(Low) 1.6257
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.1527
    R-Factor(R-Free) 0.234
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6257
    Shell Resolution(Low) 1.6635
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2597
    R-Factor(R-Work) 0.149
    R-Factor(R-Free) 0.2328
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6635
    Shell Resolution(Low) 1.7051
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2568
    R-Factor(R-Work) 0.1418
    R-Factor(R-Free) 0.2038
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7051
    Shell Resolution(Low) 1.7512
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2570
    R-Factor(R-Work) 0.1372
    R-Factor(R-Free) 0.2051
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7512
    Shell Resolution(Low) 1.8027
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2580
    R-Factor(R-Work) 0.1288
    R-Factor(R-Free) 0.2188
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8027
    Shell Resolution(Low) 1.8609
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2625
    R-Factor(R-Work) 0.1262
    R-Factor(R-Free) 0.1954
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8609
    Shell Resolution(Low) 1.9274
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2552
    R-Factor(R-Work) 0.1259
    R-Factor(R-Free) 0.1949
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9274
    Shell Resolution(Low) 2.0045
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2587
    R-Factor(R-Work) 0.1246
    R-Factor(R-Free) 0.1833
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0045
    Shell Resolution(Low) 2.0958
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2604
    R-Factor(R-Work) 0.1218
    R-Factor(R-Free) 0.1893
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0958
    Shell Resolution(Low) 2.2062
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2597
    R-Factor(R-Work) 0.1129
    R-Factor(R-Free) 0.1888
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2062
    Shell Resolution(Low) 2.3444
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2582
    R-Factor(R-Work) 0.1177
    R-Factor(R-Free) 0.1754
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3444
    Shell Resolution(Low) 2.5254
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2625
    R-Factor(R-Work) 0.1268
    R-Factor(R-Free) 0.1754
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5254
    Shell Resolution(Low) 2.7794
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2601
    R-Factor(R-Work) 0.1302
    R-Factor(R-Free) 0.2016
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7794
    Shell Resolution(Low) 3.1814
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2614
    R-Factor(R-Work) 0.14
    R-Factor(R-Free) 0.1686
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1814
    Shell Resolution(Low) 4.0073
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2640
    R-Factor(R-Work) 0.1304
    R-Factor(R-Free) 0.1641
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0073
    Shell Resolution(Low) 34.7534
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2684
    R-Factor(R-Work) 0.1659
    R-Factor(R-Free) 0.1674
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.053
    f_dihedral_angle_d 13.175
    f_angle_d 1.005
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2627
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 387
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution phaser
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building phaser
    data collection HKL-2000