X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.5
Temperature 298.0
Details 30% PEG3350, 0.2M MgCl2, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 139.45 α = 90
b = 58.76 β = 90.71
c = 140.68 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MAR scanner 300 mm plate -- 2012-06-19
Diffraction Radiation
Monochromator Protocol
SAGITALLY FOCUSED Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-G 0.97856 APS 21-ID-G

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.4 50 98.2 0.053 0.045 -- 3.5 -- n/a 1.0 1.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.4 2.44 96.3 0.299 0.364 2.55 2.7 4328

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.4 29.98 -- 1.46 88515 88346 2001 98.23 0.2162 0.2162 0.2151 0.2628 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.4 2.46 -- 141 5999 0.2715 0.3131 -- 96.0
X Ray Diffraction 2.46 2.5265 -- 130 5978 0.2685 0.35 -- 96.0
X Ray Diffraction 2.5265 2.6008 -- 145 5983 0.2597 0.3373 -- 97.0
X Ray Diffraction 2.6008 2.6847 -- 137 6088 0.2488 0.2773 -- 97.0
X Ray Diffraction 2.6847 2.7806 -- 143 6057 0.2467 0.3174 -- 98.0
X Ray Diffraction 2.7806 2.8919 -- 147 6113 0.2446 0.3096 -- 98.0
X Ray Diffraction 2.8919 3.0234 -- 143 6115 0.2461 0.307 -- 98.0
X Ray Diffraction 3.0234 3.1826 -- 141 6190 0.2427 0.301 -- 99.0
X Ray Diffraction 3.1826 3.3817 -- 140 6232 0.2404 0.316 -- 99.0
X Ray Diffraction 3.3817 3.6424 -- 148 6239 0.2271 0.2724 -- 99.0
X Ray Diffraction 3.6424 4.0082 -- 141 6223 0.1975 0.2369 -- 99.0
X Ray Diffraction 4.0082 4.5864 -- 146 6304 0.1882 0.2237 -- 100.0
X Ray Diffraction 4.5864 5.7717 -- 148 6319 0.1989 0.2356 -- 100.0
X Ray Diffraction 5.7717 29.9826 -- 151 6505 0.1779 0.2156 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model Anisotropic
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.008
f_chiral_restr 0.08
f_dihedral_angle_d 19.612
f_angle_d 1.411
f_bond_d 0.01
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 14358
Nucleic Acid Atoms 0
Heterogen Atoms 300
Solvent Atoms 251

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
phaser Structure Solution
PHENIX (phenix.refine: 1.8_1069) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8_1069) refinement
phaser model building
HKL-2000 data collection