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X-RAY DIFFRACTION
Materials and Methods page
4HW3
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 298.0
    Details 30% PEG3350, 0.2M MgCl2, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 139.45 α = 90
    b = 58.76 β = 90.71
    c = 140.68 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR scanner 300 mm plate
    Collection Date 2012-06-19
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 21-ID-G
    Wavelength List 0.97856
    Site APS
    Beamline 21-ID-G
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.4
    Resolution(Low) 50
    Percent Possible(Observed) 98.2
    R Merge I(Observed) 0.053
    Redundancy 3.5
     
    High Resolution Shell Details
    Resolution(High) 2.4
    Resolution(Low) 2.44
    Percent Possible(All) 96.3
    R Merge I(Observed) 0.299
    Mean I Over Sigma(Observed) 2.55
    R-Sym I(Observed) 0.364
    Redundancy 2.7
    Number Unique Reflections(All) 4328
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.4
    Resolution(Low) 29.98
    Cut-off Sigma(F) 1.46
    Number of Reflections(all) 88515
    Number of Reflections(Observed) 88346
    Number of Reflections(R-Free) 2001
    Percent Reflections(Observed) 98.23
    R-Factor(All) 0.2162
    R-Factor(Observed) 0.2162
    R-Work 0.2151
    R-Free 0.2628
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model Anisotropic
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4
    Shell Resolution(Low) 2.46
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 5999
    R-Factor(R-Work) 0.2715
    R-Factor(R-Free) 0.3131
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.46
    Shell Resolution(Low) 2.5265
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 5978
    R-Factor(R-Work) 0.2685
    R-Factor(R-Free) 0.35
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5265
    Shell Resolution(Low) 2.6008
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 5983
    R-Factor(R-Work) 0.2597
    R-Factor(R-Free) 0.3373
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6008
    Shell Resolution(Low) 2.6847
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 6088
    R-Factor(R-Work) 0.2488
    R-Factor(R-Free) 0.2773
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6847
    Shell Resolution(Low) 2.7806
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 6057
    R-Factor(R-Work) 0.2467
    R-Factor(R-Free) 0.3174
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7806
    Shell Resolution(Low) 2.8919
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 6113
    R-Factor(R-Work) 0.2446
    R-Factor(R-Free) 0.3096
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8919
    Shell Resolution(Low) 3.0234
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 6115
    R-Factor(R-Work) 0.2461
    R-Factor(R-Free) 0.307
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0234
    Shell Resolution(Low) 3.1826
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 6190
    R-Factor(R-Work) 0.2427
    R-Factor(R-Free) 0.301
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1826
    Shell Resolution(Low) 3.3817
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 6232
    R-Factor(R-Work) 0.2404
    R-Factor(R-Free) 0.316
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3817
    Shell Resolution(Low) 3.6424
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 6239
    R-Factor(R-Work) 0.2271
    R-Factor(R-Free) 0.2724
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6424
    Shell Resolution(Low) 4.0082
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 6223
    R-Factor(R-Work) 0.1975
    R-Factor(R-Free) 0.2369
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0082
    Shell Resolution(Low) 4.5864
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 6304
    R-Factor(R-Work) 0.1882
    R-Factor(R-Free) 0.2237
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5864
    Shell Resolution(Low) 5.7717
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 6319
    R-Factor(R-Work) 0.1989
    R-Factor(R-Free) 0.2356
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7717
    Shell Resolution(Low) 29.9826
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 6505
    R-Factor(R-Work) 0.1779
    R-Factor(R-Free) 0.2156
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.008
    f_chiral_restr 0.08
    f_dihedral_angle_d 19.612
    f_angle_d 1.411
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 14358
    Nucleic Acid Atoms 0
    Heterogen Atoms 300
    Solvent Atoms 251
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution phaser
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building phaser
    data collection HKL-2000