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X-RAY DIFFRACTION
Materials and Methods page
4HW2
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 298.0
    Details 30% PEG3350, 0.2M MgCl2, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 122 α = 90
    b = 134.33 β = 90
    c = 62.04 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR scanner 300 mm plate
    Collection Date 2012-07-11
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 21-ID-D
    Wavelength List 1.07816
    Site APS
    Beamline 21-ID-D
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.8
    Resolution(Low) 50
    Number Reflections(All) 25224
    Number Reflections(Observed) 25097
    Percent Possible(Observed) 97.7
    R Merge I(Observed) 0.047
    B(Isotropic) From Wilson Plot 4.1
     
    High Resolution Shell Details
    Resolution(High) 2.8
    Resolution(Low) 2.85
    Percent Possible(All) 95.0
    R Merge I(Observed) 0.411
    Mean I Over Sigma(Observed) 3.0
    R-Sym I(Observed) 0.297
    Redundancy 3.4
    Number Unique Reflections(All) 1223
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.8
    Resolution(Low) 30.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 25224
    Number of Reflections(Observed) 25097
    Number of Reflections(R-Free) 2490
    R-Factor(All) 0.2169
    R-Factor(Observed) 0.2169
    R-Work 0.2169
    R-Free 0.2452
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Isotropic Thermal Model Anisotropic
    Mean Isotropic B Value 51.3
    Anisotropic B[1][1] -0.23
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.02
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.25
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8
    Shell Resolution(Low) 2.9
    Number of Reflections(Observed) 2128
    Number of Reflections(R-Free) 234
    R-Factor(R-Work) 0.3151
    R-Factor(R-Free) 0.3633
    Percent Reflections(Observed) 93.3
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    c_angle_d 1.9
    c_bond_d 0.024
     
    Coordinate Error
    Luzzati ESD(Observed) 0.35
    Luzzati Sigma A(Observed) 0.45
    Luzzati Resolution Cutoff(Low) 5.0
    Luzzati ESD(R-Free Set) 0.4
    Luzzati Sigma A(R-Free Set) 0.54
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7186
    Nucleic Acid Atoms 0
    Heterogen Atoms 190
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution phaser
    Structure Refinement CNS 1.3
     
    Software
    refinement CNS version: 1.3
    model building phaser
    data collection HKL-2000