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X-RAY DIFFRACTION
Materials and Methods page
4HUR
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 298.0
    Details 2 M ammonium sulphate, 0.1 M HEPES pH 7.5, 2% PEG 400, 10 mM AcCoA, VAPOR DIFFUSION, SITTING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 92.91 α = 90
    b = 184.54 β = 90
    c = 99 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2012-07-27
     
    Diffraction Radiation
    Monochromator C(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 21-ID-F
    Wavelength List 0.97872
    Site APS
    Beamline 21-ID-F
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -2.0
    Resolution(High) 2.02
    Resolution(Low) 30
    Number Reflections(Observed) 54946
    Percent Possible(Observed) 98.2
    Redundancy 5.0
     
    High Resolution Shell Details
    Resolution(High) 2.02
    Resolution(Low) 2.05
    Percent Possible(All) 94.0
    Mean I Over Sigma(Observed) 2.13
    R-Sym I(Observed) 0.507
    Redundancy 4.5
    Number Unique Reflections(All) 2567
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.15
    Resolution(Low) 29.185
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 46063
    Number of Reflections(R-Free) 1677
    Percent Reflections(Observed) 98.88
    R-Factor(Observed) 0.168
    R-Work 0.1666
    R-Free 0.2022
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.15
    Shell Resolution(Low) 2.2132
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 3524
    R-Factor(R-Work) 0.2264
    R-Factor(R-Free) 0.2953
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2132
    Shell Resolution(Low) 2.2847
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 3604
    R-Factor(R-Work) 0.2099
    R-Factor(R-Free) 0.2873
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2847
    Shell Resolution(Low) 2.3663
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 3671
    R-Factor(R-Work) 0.1959
    R-Factor(R-Free) 0.2911
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3663
    Shell Resolution(Low) 2.461
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3723
    R-Factor(R-Work) 0.1901
    R-Factor(R-Free) 0.2387
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.461
    Shell Resolution(Low) 2.5729
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 3682
    R-Factor(R-Work) 0.1906
    R-Factor(R-Free) 0.2495
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5729
    Shell Resolution(Low) 2.7085
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 3708
    R-Factor(R-Work) 0.1782
    R-Factor(R-Free) 0.2345
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7085
    Shell Resolution(Low) 2.878
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 3711
    R-Factor(R-Work) 0.1757
    R-Factor(R-Free) 0.2372
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.878
    Shell Resolution(Low) 3.1
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 3717
    R-Factor(R-Work) 0.1772
    R-Factor(R-Free) 0.1936
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1
    Shell Resolution(Low) 3.4115
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3729
    R-Factor(R-Work) 0.1632
    R-Factor(R-Free) 0.1939
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4115
    Shell Resolution(Low) 3.9042
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 3709
    R-Factor(R-Work) 0.1391
    R-Factor(R-Free) 0.1642
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9042
    Shell Resolution(Low) 4.9151
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3762
    R-Factor(R-Work) 0.1283
    R-Factor(R-Free) 0.1624
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9151
    Shell Resolution(Low) 29.1881
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3846
    R-Factor(R-Work) 0.1785
    R-Factor(R-Free) 0.1819
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.075
    f_dihedral_angle_d 12.963
    f_angle_d 1.382
    f_bond_d 0.012
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5071
    Nucleic Acid Atoms 0
    Heterogen Atoms 280
    Solvent Atoms 618
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-3000
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution PHENIX (phenix.phaser)
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHENIX version: (phenix.phaser)
    data collection HKL-3000