X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 298.0
Details 2 M ammonium sulphate, 0.1 M HEPES pH 7.5, 2% PEG 400, 10 mM AcCoA, VAPOR DIFFUSION, SITTING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 92.91 α = 90
b = 184.54 β = 90
c = 99 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 225 mm CCD -- 2012-07-27
Diffraction Radiation
Monochromator Protocol
C(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F 0.97872 APS 21-ID-F

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.02 30 98.2 -- 0.091 -- 5.0 -- 54946 0.0 -2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.02 2.05 94.0 -- 0.507 2.13 4.5 2567

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.15 29.185 -- 1.35 -- 46063 1677 98.88 -- 0.168 0.1666 0.2022 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.15 2.2132 -- 133 3524 0.2264 0.2953 -- 95.0
X Ray Diffraction 2.2132 2.2847 -- 136 3604 0.2099 0.2873 -- 98.0
X Ray Diffraction 2.2847 2.3663 -- 139 3671 0.1959 0.2911 -- 99.0
X Ray Diffraction 2.3663 2.461 -- 141 3723 0.1901 0.2387 -- 100.0
X Ray Diffraction 2.461 2.5729 -- 140 3682 0.1906 0.2495 -- 100.0
X Ray Diffraction 2.5729 2.7085 -- 140 3708 0.1782 0.2345 -- 100.0
X Ray Diffraction 2.7085 2.878 -- 140 3711 0.1757 0.2372 -- 100.0
X Ray Diffraction 2.878 3.1 -- 140 3717 0.1772 0.1936 -- 99.0
X Ray Diffraction 3.1 3.4115 -- 141 3729 0.1632 0.1939 -- 100.0
X Ray Diffraction 3.4115 3.9042 -- 140 3709 0.1391 0.1642 -- 99.0
X Ray Diffraction 3.9042 4.9151 -- 142 3762 0.1283 0.1624 -- 99.0
X Ray Diffraction 4.9151 29.1881 -- 145 3846 0.1785 0.1819 -- 98.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_chiral_restr 0.075
f_dihedral_angle_d 12.963
f_angle_d 1.382
f_bond_d 0.012
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5071
Nucleic Acid Atoms 0
Heterogen Atoms 280
Solvent Atoms 618

Software

Computing
Computing Package Purpose
HKL-3000 Data Collection
HKL-3000 Data Reduction (intensity integration)
HKL-3000 Data Reduction (data scaling)
PHENIX (phenix.phaser) Structure Solution
PHENIX (phenix.refine: 1.8.1_1168) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8.1_1168) refinement
PHENIX version: (phenix.phaser) model building
HKL-3000 data collection