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X-RAY DIFFRACTION
Materials and Methods page
4HUJ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8.5
    Temperature 293.0
    Details 0.2M Lithium sulfate, 0.1M TRIS, 30% PEG4000 and tert-Butanol, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 58.46 α = 90
    b = 79.49 β = 90
    c = 100.13 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2012-07-16
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 0.9792
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.77
    Resolution(Low) 50
    Number Reflections(All) 46300
    Number Reflections(Observed) 46300
    Percent Possible(Observed) 99.8
    R Merge I(Observed) 0.063
    B(Isotropic) From Wilson Plot 19.2
    Redundancy 14.2
     
    High Resolution Shell Details
    Resolution(High) 1.77
    Resolution(Low) 1.82
    Percent Possible(All) 99.8
    R Merge I(Observed) 0.335
    Redundancy 13.7
    Number Unique Reflections(All) 3763
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.77
    Resolution(Low) 42.614
    Number of Reflections(all) 46126
    Number of Reflections(Observed) 43786
    Number of Reflections(R-Free) 2340
    Percent Reflections(Observed) 99.21
    R-Factor(All) 0.223
    R-Factor(Observed) 0.20697
    R-Work 0.20556
    R-Free 0.2337
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 18.322
    Anisotropic B[1][1] -0.52
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.52
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.0
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.767
    Shell Resolution(Low) 1.812
    Number of Reflections(Observed) 5491
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 3050
    R-Factor(R-Work) 0.263
    R-Factor(R-Free) 0.297
    Percent Reflections(Observed) 96.25
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 2.769
    r_scbond_it 1.604
    r_mcangle_it 1.048
    r_mcbond_it 0.553
    r_gen_planes_refined 0.005
    r_chiral_restr 0.067
    r_dihedral_angle_4_deg 21.422
    r_dihedral_angle_3_deg 11.273
    r_dihedral_angle_2_deg 31.437
    r_dihedral_angle_1_deg 4.899
    r_angle_refined_deg 1.059
    r_bond_refined_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2979
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 178
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SHELXS
    Structure Refinement REFMAC 5.5.0110
     
    Software
    refinement REFMAC version: 5.5.0110
    model building SHELXS
    data collection CBASS