X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.6
Temperature 293.0
Details 20% w/v Polyethylene glycol 3,350, 0.2 M Ammonium formate., pH 6.6, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 65.87 α = 109.04
b = 76.31 β = 104.62
c = 93.89 γ = 89.3
Symmetry
Space Group P 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2011-12-03
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-B 0.97941 APS 23-ID-B

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.2 45.91 91.72 0.077 -- -- 3.8 25229 25229 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.2 3.31 72.0 0.21 -- 5.9 3.5 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SIRAS (using Pt derivative) 3.2 45.911 0.0 0.0 25229 25229 1276 91.72 0.1727 0.1727 0.1711 0.2021 The test set was selected in thin resolution shells because of presence of NCS.
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.2 3.3281 -- 93 2113 0.2095 0.2832 -- 72.0
X Ray Diffraction 3.3281 3.4795 -- 102 2332 0.192 0.2101 -- 79.0
X Ray Diffraction 3.4795 3.6629 -- 183 2464 0.1675 0.2063 -- 87.0
X Ray Diffraction 3.6629 3.8923 -- 133 2686 0.1604 0.1944 -- 93.0
X Ray Diffraction 3.8923 4.1926 -- 139 2857 0.1524 0.1979 -- 98.0
X Ray Diffraction 4.1926 4.6142 -- 139 2868 0.136 0.1397 -- 99.0
X Ray Diffraction 4.6142 5.281 -- 208 2856 0.1377 0.1866 -- 99.0
X Ray Diffraction 5.281 6.6503 -- 139 2913 0.1941 0.2325 -- 99.0
X Ray Diffraction 6.6503 45.9156 -- 140 2864 0.2067 0.2336 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_chiral_restr 0.082
f_dihedral_angle_d 17.757
f_angle_d 1.223
f_bond_d 0.009
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 10145
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 0

Software

Computing
Computing Package Purpose
JBluIce - EPICS Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
Phenix AutoSol Structure Solution
PHENIX (phenix.refine: 1.8_1069) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8_1069) refinement
Phenix version: AutoSol model building
JBluIce version: - EPICS data collection