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X-RAY DIFFRACTION
Materials and Methods page
4HUH
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.6
    Temperature 293.0
    Details 20% w/v Polyethylene glycol 3,350, 0.2 M Ammonium formate., pH 6.6, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 65.87 α = 109.04
    b = 76.31 β = 104.62
    c = 93.89 γ = 89.3
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2011-12-03
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 23-ID-B
    Wavelength List 0.97941
    Site APS
    Beamline 23-ID-B
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 3.2
    Resolution(Low) 45.91
    Number Reflections(All) 25229
    Number Reflections(Observed) 25229
    Percent Possible(Observed) 91.72
    R Merge I(Observed) 0.077
    Redundancy 3.8
     
    High Resolution Shell Details
    Resolution(High) 3.2
    Resolution(Low) 3.31
    Percent Possible(All) 72.0
    R Merge I(Observed) 0.21
    Mean I Over Sigma(Observed) 5.9
    Redundancy 3.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SIRAS (using Pt derivative)
    reflnsShellList 3.2
    Resolution(Low) 45.911
    Cut-off Sigma(I) 0.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 25229
    Number of Reflections(Observed) 25229
    Number of Reflections(R-Free) 1276
    Percent Reflections(Observed) 91.72
    R-Factor(All) 0.1727
    R-Factor(Observed) 0.1727
    R-Work 0.1711
    R-Free 0.2021
    R-Free Selection Details The test set was selected in thin resolution shells because of presence of NCS.
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2
    Shell Resolution(Low) 3.3281
    Number of Reflections(R-Free) 93
    Number of Reflections(R-Work) 2113
    R-Factor(R-Work) 0.2095
    R-Factor(R-Free) 0.2832
    Percent Reflections(Observed) 72.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3281
    Shell Resolution(Low) 3.4795
    Number of Reflections(R-Free) 102
    Number of Reflections(R-Work) 2332
    R-Factor(R-Work) 0.192
    R-Factor(R-Free) 0.2101
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4795
    Shell Resolution(Low) 3.6629
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 2464
    R-Factor(R-Work) 0.1675
    R-Factor(R-Free) 0.2063
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6629
    Shell Resolution(Low) 3.8923
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2686
    R-Factor(R-Work) 0.1604
    R-Factor(R-Free) 0.1944
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8923
    Shell Resolution(Low) 4.1926
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2857
    R-Factor(R-Work) 0.1524
    R-Factor(R-Free) 0.1979
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1926
    Shell Resolution(Low) 4.6142
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2868
    R-Factor(R-Work) 0.136
    R-Factor(R-Free) 0.1397
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6142
    Shell Resolution(Low) 5.281
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 2856
    R-Factor(R-Work) 0.1377
    R-Factor(R-Free) 0.1866
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.281
    Shell Resolution(Low) 6.6503
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2913
    R-Factor(R-Work) 0.1941
    R-Factor(R-Free) 0.2325
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.6503
    Shell Resolution(Low) 45.9156
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2864
    R-Factor(R-Work) 0.2067
    R-Factor(R-Free) 0.2336
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.082
    f_dihedral_angle_d 17.757
    f_angle_d 1.223
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 10145
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection JBluIce - EPICS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phenix AutoSol
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building Phenix version: AutoSol
    data collection JBluIce version: - EPICS