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X-RAY DIFFRACTION
Materials and Methods page
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  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 301.0
    Details 0.15 M ammonium sulfate, 10.5 % isopropanol, 0.085 M Na Hepes pH 7.5, 20% PEG 4000, 15% glycerol., VAPOR DIFFUSION, HANGING DROP, temperature 301K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 100.68 α = 90
    b = 100.68 β = 90
    c = 155.89 γ = 120
     
    Space Group
    Space Group Name:    P 32
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2001-08-23
     
    Diffraction Radiation
    Monochromator NA
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 14-BM-C
    Wavelength List 1.0
    Site APS
    Beamline 14-BM-C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.7
    Resolution(Low) 33
    Number Reflections(All) 45176
    Number Reflections(Observed) 45176
    Percent Possible(Observed) 93.03
    R Merge I(Observed) 0.078
    Redundancy 5.5
     
    High Resolution Shell Details
    Resolution(High) 2.7
    Resolution(Low) 2.75
    Percent Possible(All) 85.0
    R Merge I(Observed) 0.27
    Mean I Over Sigma(Observed) 3.3
    Redundancy 2.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.7001
    Resolution(Low) 32.956
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 45176
    Number of Reflections(Observed) 45176
    Number of Reflections(R-Free) 2536
    Percent Reflections(Observed) 93.03
    R-Factor(All) 0.2092
    R-Factor(Observed) 0.2092
    R-Work 0.2066
    R-Free 0.2521
    R-Free Selection Details The test set was chosen in thin resolution shells because of presence of NCS.
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7001
    Shell Resolution(Low) 2.7965
    Number of Reflections(R-Free) 321
    Number of Reflections(R-Work) 3945
    R-Factor(R-Work) 0.3181
    R-Factor(R-Free) 0.3796
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7965
    Shell Resolution(Low) 2.9084
    Number of Reflections(R-Free) 341
    Number of Reflections(R-Work) 4074
    R-Factor(R-Work) 0.3024
    R-Factor(R-Free) 0.3245
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9084
    Shell Resolution(Low) 3.0407
    Number of Reflections(R-Free) 274
    Number of Reflections(R-Work) 4299
    R-Factor(R-Work) 0.2876
    R-Factor(R-Free) 0.379
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0407
    Shell Resolution(Low) 3.2009
    Number of Reflections(R-Free) 259
    Number of Reflections(R-Work) 4309
    R-Factor(R-Work) 0.2516
    R-Factor(R-Free) 0.2861
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2009
    Shell Resolution(Low) 3.4013
    Number of Reflections(R-Free) 223
    Number of Reflections(R-Work) 4424
    R-Factor(R-Work) 0.2274
    R-Factor(R-Free) 0.2958
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4013
    Shell Resolution(Low) 3.6636
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 4439
    R-Factor(R-Work) 0.1951
    R-Factor(R-Free) 0.2184
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6636
    Shell Resolution(Low) 4.0316
    Number of Reflections(R-Free) 220
    Number of Reflections(R-Work) 4418
    R-Factor(R-Work) 0.1928
    R-Factor(R-Free) 0.2376
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0316
    Shell Resolution(Low) 4.6137
    Number of Reflections(R-Free) 235
    Number of Reflections(R-Work) 4276
    R-Factor(R-Work) 0.1587
    R-Factor(R-Free) 0.2249
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6137
    Shell Resolution(Low) 5.8076
    Number of Reflections(R-Free) 210
    Number of Reflections(R-Work) 4306
    R-Factor(R-Work) 0.1644
    R-Factor(R-Free) 0.1777
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8076
    Shell Resolution(Low) 32.9584
    Number of Reflections(R-Free) 257
    Number of Reflections(R-Work) 4150
    R-Factor(R-Work) 0.2039
    R-Factor(R-Free) 0.2192
    Percent Reflections(Observed) 91.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.079
    f_dihedral_angle_d 17.404
    f_angle_d 1.298
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 10452
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 72
     
     
  •   Software and Computing Hide
    Computing
    Data Collection NA
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHASER
    data collection NA