X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 301.0
Details 0.15 M ammonium sulfate, 10.5 % isopropanol, 0.085 M Na Hepes pH 7.5, 20% PEG 4000, 15% glycerol., VAPOR DIFFUSION, HANGING DROP, temperature 301K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 100.68 α = 90
b = 100.68 β = 90
c = 155.89 γ = 120
Symmetry
Space Group P 32

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2001-08-23
Diffraction Radiation
Monochromator Protocol
NA SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 14-BM-C 1.0 APS 14-BM-C

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.7 33 93.03 0.078 -- -- 5.5 45176 45176 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.7 2.75 85.0 0.27 -- 3.3 2.3 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.7001 32.956 -- 0.0 45176 45176 2536 93.03 0.2092 0.2092 0.2066 0.2521 The test set was chosen in thin resolution shells because of presence of NCS.
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.7001 2.7965 -- 321 3945 0.3181 0.3796 -- 87.0
X Ray Diffraction 2.7965 2.9084 -- 341 4074 0.3024 0.3245 -- 91.0
X Ray Diffraction 2.9084 3.0407 -- 274 4299 0.2876 0.379 -- 94.0
X Ray Diffraction 3.0407 3.2009 -- 259 4309 0.2516 0.2861 -- 95.0
X Ray Diffraction 3.2009 3.4013 -- 223 4424 0.2274 0.2958 -- 96.0
X Ray Diffraction 3.4013 3.6636 -- 196 4439 0.1951 0.2184 -- 95.0
X Ray Diffraction 3.6636 4.0316 -- 220 4418 0.1928 0.2376 -- 95.0
X Ray Diffraction 4.0316 4.6137 -- 235 4276 0.1587 0.2249 -- 94.0
X Ray Diffraction 4.6137 5.8076 -- 210 4306 0.1644 0.1777 -- 93.0
X Ray Diffraction 5.8076 32.9584 -- 257 4150 0.2039 0.2192 -- 91.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.006
f_chiral_restr 0.079
f_dihedral_angle_d 17.404
f_angle_d 1.298
f_bond_d 0.01
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 10452
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 72

Software

Computing
Computing Package Purpose
NA Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.8.1_1168) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8.1_1168) refinement
PHASER model building
NA data collection