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X-RAY DIFFRACTION
Materials and Methods page
4HU2
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 293.0
    Details 25% (w/v) PEG 3350, 0.2 M (NH4)2SO4, 0.1 M Bis-TRIS propane, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 114.43 α = 90
    b = 27.64 β = 114.14
    c = 67.99 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210
    Collection Date 2012-01-09
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-1
    Wavelength List 0.9334
    Site ESRF
    Beamline ID14-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.8
    Observed Criterion Sigma(I) 2.8
    Resolution(High) 1.46
    Resolution(Low) 33.7
    Number Reflections(All) 34254
    Number Reflections(Observed) 34254
    Percent Possible(Observed) 98.9
    R Merge I(Observed) 3.8
     
    High Resolution Shell Details
    Resolution(High) 1.456
    Resolution(Low) 1.493
    Percent Possible(All) 98.9
    R Merge I(Observed) 0.038
    Mean I Over Sigma(Observed) 2.8
    R-Sym I(Observed) 0.038
    Redundancy 2.0
    Number Unique Reflections(All) 34254
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.46
    Resolution(Low) 33.7
    Cut-off Sigma(I) 2.8
    Cut-off Sigma(F) 2.8
    Number of Reflections(all) 32519
    Number of Reflections(Observed) 32519
    Number of Reflections(R-Free) 1728
    Percent Reflections(Observed) 98.85
    R-Factor(Observed) 0.16525
    R-Work 0.16239
    R-Free 0.21813
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 16.55
    Anisotropic B[1][1] 0.02
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.22
    Anisotropic B[2][2] 0.28
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.47
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.456
    Shell Resolution(Low) 1.493
    Number of Reflections(Observed) 32519
    Number of Reflections(R-Free) 1728
    Number of Reflections(R-Work) 2000
    R-Factor(R-Work) 0.1653
    R-Factor(R-Free) 0.218
    Percent Reflections(Observed) 98.9
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.493
    Shell Resolution(Low) 1.53
    Number of Reflections(Observed) 4636
    Number of Reflections(R-Free) 117
    R-Factor(R-Work) 0.273
    R-Factor(R-Free) 0.319
    Percent Reflections(Observed) 94.1
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_sphericity_bonded 10.183
    r_sphericity_free 31.242
    r_bond_refined_d 0.009
    r_bond_other_d 0.001
    r_angle_refined_deg 1.44
    r_angle_other_deg 0.928
    r_dihedral_angle_1_deg 5.659
    r_dihedral_angle_2_deg 34.598
    r_dihedral_angle_3_deg 11.252
    r_dihedral_angle_4_deg 16.443
    r_chiral_restr 0.082
    r_gen_planes_refined 0.006
    r_gen_planes_other 0.001
    r_rigid_bond_restr 3.062
     
    Coordinate Error
    Luzzati ESD(Observed) 0.081
    Luzzati ESD(R-Free Set) 0.077
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1455
    Nucleic Acid Atoms 0
    Heterogen Atoms 10
    Solvent Atoms 309
     
     
  •   Software and Computing Hide
    Computing
    Data Collection DNA
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement REFMAC 5.6.0117
     
    Software
    refinement REFMAC version: 5.6.0117
    model building PHASER
    data collection DNA