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X-RAY DIFFRACTION
Materials and Methods page
4HTR
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION
    pH 7.8
    Temperature 298.0
    Details PEG8000, pH 7.8, VAPOR DIFFUSION, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 66.46 α = 90
    b = 76.25 β = 90
    c = 81.38 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Details Rosenbaum-Rock vertical focusing mirror.
    Collection Date 2012-10-10
     
    Diffraction Radiation
    Monochromator Rosenbaum-Rock monochromator high-resolution double-crystal Si (111) sagittal focusing.
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1.0
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.56
    Resolution(Low) 50
    Number Reflections(Observed) 59125
    Percent Possible(Observed) 99.3
    R Merge I(Observed) 0.11
    Redundancy 11.2
     
    High Resolution Shell Details
    Resolution(High) 1.56
    Resolution(Low) 1.59
    Percent Possible(All) 90.2
    R Merge I(Observed) 0.487
    Redundancy 4.2
    Number Unique Reflections(All) 2652
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.6
    Resolution(Low) 33.069
    Cut-off Sigma(F) 0.1
    Number of Reflections(Observed) 52766
    Number of Reflections(R-Free) 1897
    Percent Reflections(Observed) 95.54
    R-Factor(Observed) 0.1604
    R-Work 0.1595
    R-Free 0.1841
     
    Temperature Factor Modeling
    Mean Isotropic B Value 16.2644
    Anisotropic B[1][1] 1.6862
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.9105
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.7758
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6
    Shell Resolution(Low) 1.64
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 3330
    R-Factor(R-Work) 0.2145
    R-Factor(R-Free) 0.2577
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.64
    Shell Resolution(Low) 1.6844
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 3421
    R-Factor(R-Work) 0.1877
    R-Factor(R-Free) 0.2254
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6844
    Shell Resolution(Low) 1.7339
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 3494
    R-Factor(R-Work) 0.1679
    R-Factor(R-Free) 0.2194
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7339
    Shell Resolution(Low) 1.7899
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 3568
    R-Factor(R-Work) 0.1696
    R-Factor(R-Free) 0.21
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7899
    Shell Resolution(Low) 1.8538
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 3572
    R-Factor(R-Work) 0.1545
    R-Factor(R-Free) 0.2009
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8538
    Shell Resolution(Low) 1.9281
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 3577
    R-Factor(R-Work) 0.1542
    R-Factor(R-Free) 0.175
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9281
    Shell Resolution(Low) 2.0158
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 3636
    R-Factor(R-Work) 0.1603
    R-Factor(R-Free) 0.1695
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0158
    Shell Resolution(Low) 2.1221
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 3632
    R-Factor(R-Work) 0.1577
    R-Factor(R-Free) 0.1963
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1221
    Shell Resolution(Low) 2.255
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 3722
    R-Factor(R-Work) 0.1598
    R-Factor(R-Free) 0.1947
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.255
    Shell Resolution(Low) 2.429
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 3653
    R-Factor(R-Work) 0.1597
    R-Factor(R-Free) 0.1726
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.429
    Shell Resolution(Low) 2.6734
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 3686
    R-Factor(R-Work) 0.1622
    R-Factor(R-Free) 0.1806
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6734
    Shell Resolution(Low) 3.06
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 3730
    R-Factor(R-Work) 0.1682
    R-Factor(R-Free) 0.219
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.06
    Shell Resolution(Low) 3.8543
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 3845
    R-Factor(R-Work) 0.1448
    R-Factor(R-Free) 0.1671
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8543
    Shell Resolution(Low) 33.0759
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 4003
    R-Factor(R-Work) 0.1523
    R-Factor(R-Free) 0.15
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 14.27
    f_plane_restr 0.006
    f_chiral_restr 0.08
    f_angle_d 1.556
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3459
    Nucleic Acid Atoms 0
    Heterogen Atoms 76
    Solvent Atoms 538
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    molecular replacement Phaser version: 2.3.0
    data reduction HKL