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X-RAY DIFFRACTION
Materials and Methods page
4HTP
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 293.15
    Details 18% PEG 1000, 200 mM Tris-HCl pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 293.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 61.21 α = 90
    b = 72.83 β = 90
    c = 158.05 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 90
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Details bending magnet
    Collection Date 2010-03-09
     
    Diffraction Radiation
    Monochromator Toroidal focusing mirror
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X6A
    Wavelength List 0.9394
    Site NSLS
    Beamline X6A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.25
    Resolution(Low) 40
    Number Reflections(All) 32066
    Number Reflections(Observed) 24874
    Percent Possible(Observed) 91.8
    R Merge I(Observed) 0.115
    Redundancy 12.4
     
    High Resolution Shell Details
    Resolution(High) 2.25
    Resolution(Low) 2.33
    Percent Possible(All) 69.2
    R Merge I(Observed) 0.663
    Mean I Over Sigma(Observed) 2.3
    R-Sym I(Observed) 0.156
    Redundancy 7.6
    Number Unique Reflections(All) 2399
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.2502
    Resolution(Low) 33.073
    Cut-off Sigma(I) 2.0
    Cut-off Sigma(F) 1.0
    Number of Reflections(all) 32066
    Number of Reflections(Observed) 27703
    Number of Reflections(R-Free) 1421
    Percent Reflections(Observed) 80.71
    R-Factor(All) 0.1989
    R-Factor(Observed) 0.1989
    R-Work 0.1962
    R-Free 0.2494
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2502
    Shell Resolution(Low) 2.3306
    Number of Reflections(R-Free) 58
    Number of Reflections(R-Work) 878
    R-Factor(R-Work) 0.2596
    R-Factor(R-Free) 0.3462
    Percent Reflections(Observed) 28.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3306
    Shell Resolution(Low) 2.4238
    Number of Reflections(R-Free) 96
    Number of Reflections(R-Work) 1522
    R-Factor(R-Work) 0.2437
    R-Factor(R-Free) 0.2933
    Percent Reflections(Observed) 48.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4238
    Shell Resolution(Low) 2.5341
    Number of Reflections(R-Free) 88
    Number of Reflections(R-Work) 2027
    R-Factor(R-Work) 0.2332
    R-Factor(R-Free) 0.2657
    Percent Reflections(Observed) 63.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5341
    Shell Resolution(Low) 2.6677
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2515
    R-Factor(R-Work) 0.2327
    R-Factor(R-Free) 0.2783
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6677
    Shell Resolution(Low) 2.8347
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 2973
    R-Factor(R-Work) 0.2405
    R-Factor(R-Free) 0.312
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8347
    Shell Resolution(Low) 3.0534
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 3198
    R-Factor(R-Work) 0.2318
    R-Factor(R-Free) 0.2863
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0534
    Shell Resolution(Low) 3.3605
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 3189
    R-Factor(R-Work) 0.2194
    R-Factor(R-Free) 0.2914
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3605
    Shell Resolution(Low) 3.8461
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 3260
    R-Factor(R-Work) 0.1762
    R-Factor(R-Free) 0.2325
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8461
    Shell Resolution(Low) 4.8432
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 3288
    R-Factor(R-Work) 0.1488
    R-Factor(R-Free) 0.1877
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8432
    Shell Resolution(Low) 33.0761
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 3432
    R-Factor(R-Work) 0.1777
    R-Factor(R-Free) 0.21
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.067
    f_dihedral_angle_d 16.084
    f_angle_d 1.067
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3643
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 229
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHASER
    data collection HKL-2000