X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8
Temperature 293.15
Details 18% PEG 1000, 200 mM Tris-HCl pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 293.15K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 61.21 α = 90
b = 72.83 β = 90
c = 158.05 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 90
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 270 bending magnet 2010-03-09
Diffraction Radiation
Monochromator Protocol
Toroidal focusing mirror SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X6A 0.9394 NSLS X6A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.25 40 91.8 0.115 0.115 -- 12.4 32066 24874 1.0 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.25 2.33 69.2 0.663 0.156 2.3 7.6 2399

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.2502 33.073 2.0 1.0 32066 27703 1421 80.71 0.1989 0.1989 0.1962 0.2494 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.2502 2.3306 -- 58 878 0.2596 0.3462 -- 28.0
X Ray Diffraction 2.3306 2.4238 -- 96 1522 0.2437 0.2933 -- 48.0
X Ray Diffraction 2.4238 2.5341 -- 88 2027 0.2332 0.2657 -- 63.0
X Ray Diffraction 2.5341 2.6677 -- 137 2515 0.2327 0.2783 -- 78.0
X Ray Diffraction 2.6677 2.8347 -- 183 2973 0.2405 0.312 -- 93.0
X Ray Diffraction 2.8347 3.0534 -- 173 3198 0.2318 0.2863 -- 98.0
X Ray Diffraction 3.0534 3.3605 -- 182 3189 0.2194 0.2914 -- 99.0
X Ray Diffraction 3.3605 3.8461 -- 167 3260 0.1762 0.2325 -- 99.0
X Ray Diffraction 3.8461 4.8432 -- 160 3288 0.1488 0.1877 -- 99.0
X Ray Diffraction 4.8432 33.0761 -- 177 3432 0.1777 0.21 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.067
f_dihedral_angle_d 16.084
f_angle_d 1.067
f_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3643
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 229

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.8_1069) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8_1069) refinement
PHASER model building
HKL-2000 data collection