X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7
Temperature 293.15
Details 16 % PEG 3350, 200 mM (NH4)3SO4, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 293.15K
Method Vapor Diffusion Hanging Drop
pH 7
Temperature 293.15
Details 16 % PEG 3350, 200 mM (NH4)3PO4, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 293.15K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 196.24 α = 90
b = 196.24 β = 90
c = 196.24 γ = 90
Symmetry
Space Group F 41 3 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 90
2 90
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 270 Bending magnet 2010-03-09
CCD ADSC QUANTUM 315 Undulator 2010-03-09
Diffraction Radiation
Monochromator Protocol
Toroidal focusing mirror MAD
Hohzu HLH8-24 SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X6A 0.9791, 0.9537, 0.9796 NSLS X6A
SYNCHROTRON APS BEAMLINE 24-ID-C 0.9795 APS 24-ID-C

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.8 40.06 99.8 0.064 0.064 -- 22.7 9362 8420 1.0 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.8 2.91 100.0 0.684 0.684 6.1 23.6 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 2.8068 40.057 -- 1.35 9362 8350 418 99.57 -- 0.21 0.2074 0.259 random 5%
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.8068 3.2128 -- 135 2573 0.2127 0.3304 -- 100.0
X Ray Diffraction 3.2128 4.0472 -- 138 2596 0.2147 0.2516 -- 100.0
X Ray Diffraction 4.0472 40.0606 -- 145 2763 0.2031 0.2498 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_chiral_restr 0.077
f_dihedral_angle_d 17.682
f_angle_d 1.105
f_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1614
Nucleic Acid Atoms 0
Heterogen Atoms 10
Solvent Atoms 23

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
SHARP Structure Solution
PHENIX (phenix.refine: 1.8.1_1168) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8.1_1168) refinement
SHARP model building
HKL-2000 data collection