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X-RAY DIFFRACTION
Materials and Methods page
4HTO
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 293.15
    Details 16 % PEG 3350, 200 mM (NH4)3SO4, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 293.15K
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 293.15
    Details 16 % PEG 3350, 200 mM (NH4)3PO4, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 293.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 196.24 α = 90
    b = 196.24 β = 90
    c = 196.24 γ = 90
     
    Space Group
    Space Group Name:    F 41 3 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 90
    Diffrn ID 2
    Data Collection Temperature 90
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 270
    Details Bending magnet
    Collection Date 2010-03-09
    Detector CCD
    Type ADSC QUANTUM 315
    Details Undulator
    Collection Date 2010-03-09
     
    Diffraction Radiation
    Monochromator Toroidal focusing mirror
    Diffraction Protocol MAD
    Monochromator Hohzu HLH8-24
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X6A
    Wavelength List 0.9791, 0.9537, 0.9796
    Site NSLS
    Beamline X6A
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-C
    Wavelength List 0.9795
    Site APS
    Beamline 24-ID-C
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.8
    Resolution(Low) 40.06
    Number Reflections(All) 9362
    Number Reflections(Observed) 8420
    Percent Possible(Observed) 99.8
    R Merge I(Observed) 0.064
    Redundancy 22.7
     
    High Resolution Shell Details
    Resolution(High) 2.8
    Resolution(Low) 2.91
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.684
    Mean I Over Sigma(Observed) 6.1
    R-Sym I(Observed) 0.684
    Redundancy 23.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MAD
    reflnsShellList 2.8068
    Resolution(Low) 40.057
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 9362
    Number of Reflections(Observed) 8350
    Number of Reflections(R-Free) 418
    Percent Reflections(Observed) 99.57
    R-Factor(Observed) 0.21
    R-Work 0.2074
    R-Free 0.259
    R-Free Selection Details random 5%
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8068
    Shell Resolution(Low) 3.2128
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2573
    R-Factor(R-Work) 0.2127
    R-Factor(R-Free) 0.3304
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2128
    Shell Resolution(Low) 4.0472
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2596
    R-Factor(R-Work) 0.2147
    R-Factor(R-Free) 0.2516
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0472
    Shell Resolution(Low) 40.0606
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2763
    R-Factor(R-Work) 0.2031
    R-Factor(R-Free) 0.2498
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.077
    f_dihedral_angle_d 17.682
    f_angle_d 1.105
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1614
    Nucleic Acid Atoms 0
    Heterogen Atoms 10
    Solvent Atoms 23
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SHARP
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building SHARP
    data collection HKL-2000