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X-RAY DIFFRACTION
Materials and Methods page
4HTE
  •   Crystallization Hide
    Crystallization Experiments
    Method vapor diffusion, hanging drop
    pH 8
    Temperature 293.0
    Details 12-16% PEG 6000, 0.1 M Tris-HCl pH 8.0, 0.5 M LiCl, 12.5% glycerol, and 5% PEG-400, vapor diffusion, hanging drop, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 75.28 α = 90
    b = 75.28 β = 90
    c = 179.85 γ = 90
     
    Space Group
    Space Group Name:    P 43 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Collection Date 2011-08
     
    Diffraction Radiation
    Diffraction Protocol MULTIPLE WAVELENGTH ANOMALOUS SCATTERING
     
    Diffraction Source
    Source synchrotron
    Type APS Beamline 23 ID
    Wavelength List 0.97935,0.97954, 0.94936
    Site APS
    Beamline 23 ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 3
    Resolution(Low) 100
    Number Reflections(Observed) 11051
    Percent Possible(Observed) 99.7
    R Merge I(Observed) 0.083
    Redundancy 9.4
     
    High Resolution Shell Details
    Resolution(High) 3.0
    Resolution(Low) 3.05
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.77
    Mean I Over Sigma(Observed) 2.8
    Redundancy 9.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MAD
    reflnsShellList 3.0
    Resolution(Low) 45.809
    Cut-off Sigma(F) 0.79
    Number of Reflections(Observed) 10958
    Number of Reflections(R-Free) 1097
    Percent Reflections(Observed) 99.76
    R-Factor(Observed) 0.2699
    R-Work 0.2674
    R-Free 0.2916
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -1.8312
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -1.8312
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 3.6623
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0001
    Shell Resolution(Low) 3.1366
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 1210
    R-Factor(R-Work) 0.3684
    R-Factor(R-Free) 0.4302
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1366
    Shell Resolution(Low) 3.3019
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 1188
    R-Factor(R-Work) 0.3327
    R-Factor(R-Free) 0.4064
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3019
    Shell Resolution(Low) 3.5087
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1205
    R-Factor(R-Work) 0.2975
    R-Factor(R-Free) 0.3093
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5087
    Shell Resolution(Low) 3.7795
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1223
    R-Factor(R-Work) 0.2721
    R-Factor(R-Free) 0.3105
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7795
    Shell Resolution(Low) 4.1596
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1210
    R-Factor(R-Work) 0.2418
    R-Factor(R-Free) 0.2456
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1596
    Shell Resolution(Low) 4.761
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 1239
    R-Factor(R-Work) 0.2217
    R-Factor(R-Free) 0.2358
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.761
    Shell Resolution(Low) 5.9962
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1251
    R-Factor(R-Work) 0.2892
    R-Factor(R-Free) 0.3181
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.9962
    Shell Resolution(Low) 45.8142
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 1335
    R-Factor(R-Work) 0.2373
    R-Factor(R-Free) 0.2547
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.001
    f_chiral_restr 0.036
    f_dihedral_angle_d 15.263
    f_angle_d 0.553
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2675
    Nucleic Acid Atoms 0
    Heterogen Atoms 1
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL
    Data Reduction (data scaling) HKL
    Structure Solution SOLVE
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    density modification RESOLVE
    phasing SOLVE
    data reduction HKL