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X-RAY DIFFRACTION
Materials and Methods page
4HSU
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6
    Temperature 277.0
    Details 0.02M Citric acid, 0.03M Bis_tris propane, 10% PEG3350, pH 6.0, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 62.75 α = 90
    b = 89.48 β = 102.89
    c = 88.35 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type ADSC QUANTUM 315r
    Collection Date 2011-04-23
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.97930
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.99
    Resolution(Low) 50
    Number Reflections(Observed) 64821
    Percent Possible(Observed) 98.99
    B(Isotropic) From Wilson Plot 29.89
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.988
    Resolution(Low) 40.436
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 64821
    Number of Reflections(R-Free) 3289
    Percent Reflections(Observed) 98.99
    R-Factor(Observed) 0.2005
    R-Work 0.1988
    R-Free 0.2319
     
    Temperature Factor Modeling
    Mean Isotropic B Value 38.2711
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9883
    Shell Resolution(Low) 2.018
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2168
    R-Factor(R-Work) 0.2888
    R-Factor(R-Free) 0.3278
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.018
    Shell Resolution(Low) 2.0496
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2662
    R-Factor(R-Work) 0.2849
    R-Factor(R-Free) 0.3648
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0496
    Shell Resolution(Low) 2.0832
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2692
    R-Factor(R-Work) 0.2689
    R-Factor(R-Free) 0.3197
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0832
    Shell Resolution(Low) 2.1191
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2663
    R-Factor(R-Work) 0.2698
    R-Factor(R-Free) 0.2724
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1191
    Shell Resolution(Low) 2.1576
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2693
    R-Factor(R-Work) 0.254
    R-Factor(R-Free) 0.3173
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1576
    Shell Resolution(Low) 2.1991
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2673
    R-Factor(R-Work) 0.2408
    R-Factor(R-Free) 0.271
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1991
    Shell Resolution(Low) 2.244
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2701
    R-Factor(R-Work) 0.2441
    R-Factor(R-Free) 0.2337
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.244
    Shell Resolution(Low) 2.2928
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2661
    R-Factor(R-Work) 0.2327
    R-Factor(R-Free) 0.2781
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2928
    Shell Resolution(Low) 2.3461
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2704
    R-Factor(R-Work) 0.2337
    R-Factor(R-Free) 0.2725
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3461
    Shell Resolution(Low) 2.4048
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2681
    R-Factor(R-Work) 0.2249
    R-Factor(R-Free) 0.2767
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4048
    Shell Resolution(Low) 2.4698
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2693
    R-Factor(R-Work) 0.2249
    R-Factor(R-Free) 0.2742
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4698
    Shell Resolution(Low) 2.5424
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2702
    R-Factor(R-Work) 0.2237
    R-Factor(R-Free) 0.274
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5424
    Shell Resolution(Low) 2.6245
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2723
    R-Factor(R-Work) 0.2227
    R-Factor(R-Free) 0.2927
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6245
    Shell Resolution(Low) 2.7183
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2693
    R-Factor(R-Work) 0.218
    R-Factor(R-Free) 0.3052
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7183
    Shell Resolution(Low) 2.8271
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2685
    R-Factor(R-Work) 0.2168
    R-Factor(R-Free) 0.231
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8271
    Shell Resolution(Low) 2.9557
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2705
    R-Factor(R-Work) 0.2223
    R-Factor(R-Free) 0.2738
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9557
    Shell Resolution(Low) 3.1115
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2701
    R-Factor(R-Work) 0.2262
    R-Factor(R-Free) 0.2437
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1115
    Shell Resolution(Low) 3.3064
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2734
    R-Factor(R-Work) 0.2112
    R-Factor(R-Free) 0.2597
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3064
    Shell Resolution(Low) 3.5615
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2678
    R-Factor(R-Work) 0.1989
    R-Factor(R-Free) 0.2324
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5615
    Shell Resolution(Low) 3.9196
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2718
    R-Factor(R-Work) 0.1761
    R-Factor(R-Free) 0.217
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9196
    Shell Resolution(Low) 4.4862
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2686
    R-Factor(R-Work) 0.1511
    R-Factor(R-Free) 0.1617
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4862
    Shell Resolution(Low) 5.6497
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2743
    R-Factor(R-Work) 0.1479
    R-Factor(R-Free) 0.1853
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6497
    Shell Resolution(Low) 40.4448
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2773
    R-Factor(R-Work) 0.1638
    R-Factor(R-Free) 0.1748
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 15.851
    f_plane_restr 0.01
    f_chiral_restr 0.061
    f_angle_d 0.928
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6135
    Nucleic Acid Atoms 0
    Heterogen Atoms 56
    Solvent Atoms 314
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHASER
    data collection HKL-2000