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X-RAY DIFFRACTION
Materials and Methods page
4HSI
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.5
    Temperature 298.0
    Details 15% PEG 4000, 0.2 M NaCl, 0.1 M Na-citrate, pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 117.29 α = 90
    b = 117.29 β = 90
    c = 321.87 γ = 120
     
    Space Group
    Space Group Name:    P 3
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2010-10-08
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X25
    Wavelength List 1.1000
    Site NSLS
    Beamline X25
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 3.1
    Resolution(Low) 45.91
    Number Reflections(All) 89814
    Number Reflections(Observed) 74374
    Percent Possible(Observed) 82.8
    R Merge I(Observed) 0.067
    B(Isotropic) From Wilson Plot 52.48
    Redundancy 2.0
     
    High Resolution Shell Details
    Resolution(High) 3.1
    Resolution(Low) 3.21
    Percent Possible(All) 87.5
    R Merge I(Observed) 0.236
    Mean I Over Sigma(Observed) 3.0
    Redundancy 1.9
    Number Unique Reflections(All) 7834
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method fourier synthesis
    reflnsShellList 3.101
    Resolution(Low) 45.906
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 89814
    Number of Reflections(Observed) 74374
    Number of Reflections(R-Free) 4373
    Percent Reflections(Observed) 82.8
    R-Factor(All) 0.2303
    R-Factor(Observed) 0.2303
    R-Work 0.2052
    R-Free 0.2549
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1667
    Shell Resolution(Low) 3.2163
    Number of Reflections(R-Free) 667
    Number of Reflections(R-Work) 2612
    R-Factor(R-Work) 0.3155
    R-Factor(R-Free) 0.4216
    Percent Reflections(Observed) 69.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2163
    Shell Resolution(Low) 3.2692
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 3413
    R-Factor(R-Work) 0.3164
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2692
    Shell Resolution(Low) 3.3258
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 3299
    R-Factor(R-Work) 0.3029
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3258
    Shell Resolution(Low) 3.3865
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 3202
    R-Factor(R-Work) 0.2876
    R-Factor(R-Free) 0.3587
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3865
    Shell Resolution(Low) 3.4519
    Number of Reflections(R-Free) 491
    Number of Reflections(R-Work) 2854
    R-Factor(R-Work) 0.2639
    R-Factor(R-Free) 0.3223
    Percent Reflections(Observed) 74.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4519
    Shell Resolution(Low) 3.5226
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 3269
    R-Factor(R-Work) 0.269
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5226
    Shell Resolution(Low) 3.5995
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 3261
    R-Factor(R-Work) 0.2499
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5995
    Shell Resolution(Low) 3.6837
    Number of Reflections(R-Free) 355
    Number of Reflections(R-Work) 2957
    R-Factor(R-Work) 0.2501
    R-Factor(R-Free) 0.2988
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6837
    Shell Resolution(Low) 3.7762
    Number of Reflections(R-Free) 288
    Number of Reflections(R-Work) 2964
    R-Factor(R-Work) 0.233
    R-Factor(R-Free) 0.2862
    Percent Reflections(Observed) 77.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7762
    Shell Resolution(Low) 3.8789
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 3220
    R-Factor(R-Work) 0.2238
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8789
    Shell Resolution(Low) 3.9937
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 3243
    R-Factor(R-Work) 0.2137
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9937
    Shell Resolution(Low) 4.1235
    Number of Reflections(R-Free) 480
    Number of Reflections(R-Work) 2715
    R-Factor(R-Work) 0.2059
    R-Factor(R-Free) 0.2866
    Percent Reflections(Observed) 71.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1235
    Shell Resolution(Low) 4.2719
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 3011
    R-Factor(R-Work) 0.1911
    R-Factor(R-Free) 0.2631
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2719
    Shell Resolution(Low) 4.4443
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 3210
    R-Factor(R-Work) 0.1739
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4443
    Shell Resolution(Low) 4.6484
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 3131
    R-Factor(R-Work) 0.16
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6484
    Shell Resolution(Low) 4.8961
    Number of Reflections(R-Free) 612
    Number of Reflections(R-Work) 2554
    R-Factor(R-Work) 0.1768
    R-Factor(R-Free) 0.2315
    Percent Reflections(Observed) 66.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8961
    Shell Resolution(Low) 5.2067
    Number of Reflections(R-Free) 1
    Number of Reflections(R-Work) 3062
    R-Factor(R-Work) 0.1782
    R-Factor(R-Free) 0.0134
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2067
    Shell Resolution(Low) 5.615
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 3054
    R-Factor(R-Work) 0.2062
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.615
    Shell Resolution(Low) 6.1916
    Number of Reflections(R-Free) 0
    Number of Reflections(R-Work) 3009
    R-Factor(R-Work) 0.2344
    R-Factor(R-Free) 0.0
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.1916
    Shell Resolution(Low) 7.1142
    Number of Reflections(R-Free) 571
    Number of Reflections(R-Work) 2362
    R-Factor(R-Work) 0.2235
    R-Factor(R-Free) 0.2711
    Percent Reflections(Observed) 62.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.077
    f_dihedral_angle_d 17.548
    f_angle_d 1.205
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 19475
    Nucleic Acid Atoms 0
    Heterogen Atoms 160
    Solvent Atoms 18
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    model building PHENIX
    data collection HKL-2000