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X-RAY DIFFRACTION
Materials and Methods page
4HSE
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 293.0
    Details 0.1 M Tris/HCl pH 7.5, 1.0 M LiCl, 18 (w/v) % PEG 6000, 10 mM MgCl2, 10 mM GdmCl, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 60.99 α = 90
    b = 60.99 β = 90
    c = 213.87 γ = 120
     
    Space Group
    Space Group Name:    P 31 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type PSI PILATUS 6M
    Collection Date 2012-06-17
     
    Diffraction Radiation
    Monochromator DOUBLE CRYSTAL SAGITALLY FOCUSING SI(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X10SA
    Wavelength List 0.9785
    Site SLS
    Beamline X10SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.2
    Resolution(Low) 50
    Number Reflections(All) 24236
    Number Reflections(Observed) 24236
    Percent Possible(Observed) 99.4
    R Merge I(Observed) 0.054
    B(Isotropic) From Wilson Plot 39.9
    Redundancy 4.9
     
    High Resolution Shell Details
    Resolution(High) 2.2
    Resolution(Low) 2.3
    Percent Possible(All) 99.1
    R Merge I(Observed) 0.391
    Mean I Over Sigma(Observed) 4.8
    Redundancy 5.2
    Number Unique Reflections(All) 2926
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.2
    Resolution(Low) 47.36
    Number of Reflections(all) 23027
    Number of Reflections(Observed) 23027
    Number of Reflections(R-Free) 1207
    Percent Reflections(Observed) 100.0
    R-Factor(Observed) 0.22742
    R-Work 0.22536
    R-Free 0.26631
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 43.543
    Anisotropic B[1][1] 0.79
    Anisotropic B[1][2] 0.39
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.79
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.18
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2
    Shell Resolution(Low) 2.257
    Number of Reflections(Observed) 1652
    Number of Reflections(R-Free) 87
    Number of Reflections(R-Work) 1652
    R-Factor(R-Work) 0.258
    R-Factor(R-Free) 0.313
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_scangle_it 2.95
    r_scbond_it 1.66
    r_mcangle_it 0.923
    r_mcbond_it 0.459
    r_gen_planes_refined 0.004
    r_chiral_restr 0.078
    r_dihedral_angle_4_deg 16.866
    r_dihedral_angle_3_deg 16.011
    r_dihedral_angle_2_deg 34.102
    r_dihedral_angle_1_deg 4.79
    r_angle_refined_deg 1.189
    r_bond_refined_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2946
    Nucleic Acid Atoms 0
    Heterogen Atoms 32
    Solvent Atoms 86
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution Phaser
    Structure Refinement REFMAC 5.5.0102
     
    Software
    refinement REFMAC version: 5.5.0102
    model building Phaser