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X-RAY DIFFRACTION
Materials and Methods page
4HSB
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 294.15
    Details 50 mM HEPES, 200 mM KCl, 25 mM MgSO4 , pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 294.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 54.89 α = 90
    b = 54.89 β = 90
    c = 153.46 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 110
     
    Diffraction Detector
    Detector AREA DETECTOR
    Type MAR scanner 300 mm plate
    Collection Date 2011-06-23
     
    Diffraction Radiation
    Monochromator C(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 21-ID-G
    Wavelength List 0.97857
    Site APS
    Beamline 21-ID-G
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.9
    Resolution(Low) 51.15
    Number Reflections(All) 22239
    Number Reflections(Observed) 22239
    Percent Possible(Observed) 99.7
    Redundancy 10.6
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 1.97
    Percent Possible(All) 98.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.9
    Resolution(Low) 29.855
    Cut-off Sigma(F) 1.38
    Number of Reflections(all) 22187
    Number of Reflections(Observed) 22187
    Number of Reflections(R-Free) 1121
    Percent Reflections(Observed) 99.77
    R-Factor(Observed) 0.1937
    R-Work 0.1916
    R-Free 0.2345
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8911
    Shell Resolution(Low) 1.9772
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2542
    R-Factor(R-Work) 0.196
    R-Factor(R-Free) 0.2318
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9772
    Shell Resolution(Low) 2.0814
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2569
    R-Factor(R-Work) 0.1795
    R-Factor(R-Free) 0.234
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0814
    Shell Resolution(Low) 2.2117
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2606
    R-Factor(R-Work) 0.1679
    R-Factor(R-Free) 0.2223
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2117
    Shell Resolution(Low) 2.3825
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2618
    R-Factor(R-Work) 0.1714
    R-Factor(R-Free) 0.2288
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3825
    Shell Resolution(Low) 2.6221
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2614
    R-Factor(R-Work) 0.176
    R-Factor(R-Free) 0.22
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6221
    Shell Resolution(Low) 3.0012
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2610
    R-Factor(R-Work) 0.1897
    R-Factor(R-Free) 0.2488
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0012
    Shell Resolution(Low) 3.78
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2683
    R-Factor(R-Work) 0.1954
    R-Factor(R-Free) 0.2491
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.78
    Shell Resolution(Low) 29.8584
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2824
    R-Factor(R-Work) 0.2079
    R-Factor(R-Free) 0.2284
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.07
    f_dihedral_angle_d 21.017
    f_angle_d 1.117
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1617
    Nucleic Acid Atoms 441
    Heterogen Atoms 14
    Solvent Atoms 114
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MD-2
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHASER
    data collection MD-2