X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 294.15
Details 50 mM HEPES, 200 mM KCl, 25 mM MgSO4 , pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 294.15K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 54.89 α = 90
b = 54.89 β = 90
c = 153.46 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 110
Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR MAR scanner 300 mm plate -- 2011-06-23
Diffraction Radiation
Monochromator Protocol
C(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-G 0.97857 APS 21-ID-G

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 51.15 99.7 -- 0.07 -- 10.6 22239 22239 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.9 1.97 98.8 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.9 29.855 -- 1.38 22187 22187 1121 99.77 -- 0.1937 0.1916 0.2345 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8911 1.9772 -- 140 2542 0.196 0.2318 -- 99.0
X Ray Diffraction 1.9772 2.0814 -- 156 2569 0.1795 0.234 -- 100.0
X Ray Diffraction 2.0814 2.2117 -- 131 2606 0.1679 0.2223 -- 100.0
X Ray Diffraction 2.2117 2.3825 -- 138 2618 0.1714 0.2288 -- 100.0
X Ray Diffraction 2.3825 2.6221 -- 132 2614 0.176 0.22 -- 100.0
X Ray Diffraction 2.6221 3.0012 -- 159 2610 0.1897 0.2488 -- 100.0
X Ray Diffraction 3.0012 3.78 -- 133 2683 0.1954 0.2491 -- 100.0
X Ray Diffraction 3.78 29.8584 -- 132 2824 0.2079 0.2284 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_chiral_restr 0.07
f_dihedral_angle_d 21.017
f_angle_d 1.117
f_bond_d 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1617
Nucleic Acid Atoms 441
Heterogen Atoms 14
Solvent Atoms 114

Software

Computing
Computing Package Purpose
MD-2 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.8.1_1168) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8.1_1168) refinement
PHASER model building
MD-2 data collection