POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
4HRV
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8
    Temperature 277.0
    Details 25% ethylene glycol, pH 8.0, VAPOR DIFFUSION, SITTING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 43.91 α = 90
    b = 96.13 β = 112.82
    c = 44.98 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2011-11-18
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.9792
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.89
    Resolution(Low) 50
    Number Reflections(All) 23423
    Number Reflections(Observed) 22968
    Percent Possible(Observed) 98.0
     
    High Resolution Shell Details
    Resolution(High) 1.89
    Resolution(Low) 2.07
    Percent Possible(All) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.89
    Resolution(Low) 31.393
    Cut-off Sigma(F) 0.15
    Number of Reflections(all) 23423
    Number of Reflections(Observed) 22968
    Number of Reflections(R-Free) 2007
    Percent Reflections(Observed) 95.97
    R-Factor(Observed) 0.233
    R-Work 0.2316
    R-Free 0.2502
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 3.4728
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 8.9105
    Anisotropic B[2][2] -13.8538
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 10.3809
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.89
    Shell Resolution(Low) 1.9571
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 2113
    R-Factor(R-Work) 0.3179
    R-Factor(R-Free) 0.3429
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9571
    Shell Resolution(Low) 2.0354
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 2345
    R-Factor(R-Work) 0.2652
    R-Factor(R-Free) 0.2913
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0354
    Shell Resolution(Low) 2.128
    Number of Reflections(R-Free) 210
    Number of Reflections(R-Work) 2427
    R-Factor(R-Work) 0.2527
    R-Factor(R-Free) 0.2895
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.128
    Shell Resolution(Low) 2.2402
    Number of Reflections(R-Free) 205
    Number of Reflections(R-Work) 2469
    R-Factor(R-Work) 0.239
    R-Factor(R-Free) 0.2495
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2402
    Shell Resolution(Low) 2.3805
    Number of Reflections(R-Free) 199
    Number of Reflections(R-Work) 2462
    R-Factor(R-Work) 0.2338
    R-Factor(R-Free) 0.2579
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3805
    Shell Resolution(Low) 2.5642
    Number of Reflections(R-Free) 206
    Number of Reflections(R-Work) 2485
    R-Factor(R-Work) 0.2468
    R-Factor(R-Free) 0.2593
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5642
    Shell Resolution(Low) 2.8221
    Number of Reflections(R-Free) 210
    Number of Reflections(R-Work) 2528
    R-Factor(R-Work) 0.2387
    R-Factor(R-Free) 0.2556
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8221
    Shell Resolution(Low) 3.2301
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 2539
    R-Factor(R-Work) 0.2588
    R-Factor(R-Free) 0.3165
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2301
    Shell Resolution(Low) 4.0682
    Number of Reflections(R-Free) 210
    Number of Reflections(R-Work) 2558
    R-Factor(R-Work) 0.225
    R-Factor(R-Free) 0.2316
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0682
    Shell Resolution(Low) 31.3971
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 2507
    R-Factor(R-Work) 0.2053
    R-Factor(R-Free) 0.2158
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.061
    f_dihedral_angle_d 12.949
    f_angle_d 0.96
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2088
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 36
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHENIX
    data collection ADSC version: Quantum