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X-RAY DIFFRACTION
Materials and Methods page
4HQQ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.2
    Temperature 293.0
    Details 38% (w/v) PEG 8000, 0.2 M NaCl, 0.1 M sodium phosphate-citrate pH 4.2, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 62.95 α = 90
    b = 70.44 β = 90
    c = 135.82 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 200
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2012-02-06
     
    Diffraction Radiation
    Monochromator Si220
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1.00
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.4
    Resolution(Low) 50
    Number Reflections(All) 24300
    Number Reflections(Observed) 23741
    Percent Possible(Observed) 97.7
     
    High Resolution Shell Details
    Resolution(High) 2.4
    Resolution(Low) 2.44
    Percent Possible(All) 82.8
    R Merge I(Observed) 0.506
    Redundancy 3.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.4
    Resolution(Low) 25.843
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 24286
    Number of Reflections(Observed) 23681
    Number of Reflections(R-Free) 1219
    Percent Reflections(Observed) 97.51
    R-Factor(Observed) 0.1852
    R-Work 0.1831
    R-Free 0.2251
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4
    Shell Resolution(Low) 2.4962
    Number of Reflections(R-Free) 98
    Number of Reflections(R-Work) 2158
    R-Factor(R-Work) 0.2487
    R-Factor(R-Free) 0.3268
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4962
    Shell Resolution(Low) 2.6097
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2404
    R-Factor(R-Work) 0.235
    R-Factor(R-Free) 0.2572
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6097
    Shell Resolution(Low) 2.7471
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2486
    R-Factor(R-Work) 0.2306
    R-Factor(R-Free) 0.2795
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7471
    Shell Resolution(Low) 2.919
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2514
    R-Factor(R-Work) 0.2243
    R-Factor(R-Free) 0.2601
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.919
    Shell Resolution(Low) 3.1441
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2544
    R-Factor(R-Work) 0.2147
    R-Factor(R-Free) 0.2485
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1441
    Shell Resolution(Low) 3.4598
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2521
    R-Factor(R-Work) 0.1882
    R-Factor(R-Free) 0.2549
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4598
    Shell Resolution(Low) 3.9589
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 2536
    R-Factor(R-Work) 0.181
    R-Factor(R-Free) 0.2062
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9589
    Shell Resolution(Low) 4.9819
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2591
    R-Factor(R-Work) 0.1409
    R-Factor(R-Free) 0.198
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9819
    Shell Resolution(Low) 25.843
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2708
    R-Factor(R-Work) 0.1682
    R-Factor(R-Free) 0.2024
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.059
    f_dihedral_angle_d 12.331
    f_angle_d 0.871
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3232
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 191
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SERGUI
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHASER
    data collection SERGUI