X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 4.2
Temperature 293.0
Details 38% (w/v) PEG 8000, 0.2 M NaCl, 0.1 M sodium phosphate-citrate pH 4.2, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 62.95 α = 90
b = 70.44 β = 90
c = 135.82 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 200
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 225 mm CCD -- 2012-02-06
Diffraction Radiation
Monochromator Protocol
Si220 SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-BM 1.00 APS 22-BM

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.4 50 97.7 -- -- -- -- 24300 23741 1.0 1.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.4 2.44 82.8 0.506 -- -- 3.3 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.4 25.843 -- 1.34 24286 23681 1219 97.51 -- 0.1852 0.1831 0.2251 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.4 2.4962 -- 98 2158 0.2487 0.3268 -- 86.0
X Ray Diffraction 2.4962 2.6097 -- 143 2404 0.235 0.2572 -- 95.0
X Ray Diffraction 2.6097 2.7471 -- 120 2486 0.2306 0.2795 -- 99.0
X Ray Diffraction 2.7471 2.919 -- 139 2514 0.2243 0.2601 -- 99.0
X Ray Diffraction 2.919 3.1441 -- 129 2544 0.2147 0.2485 -- 99.0
X Ray Diffraction 3.1441 3.4598 -- 134 2521 0.1882 0.2549 -- 100.0
X Ray Diffraction 3.4598 3.9589 -- 169 2536 0.181 0.2062 -- 100.0
X Ray Diffraction 3.9589 4.9819 -- 145 2591 0.1409 0.198 -- 100.0
X Ray Diffraction 4.9819 25.843 -- 142 2708 0.1682 0.2024 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.059
f_dihedral_angle_d 12.331
f_angle_d 0.871
f_bond_d 0.004
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3232
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 191

Software

Computing
Computing Package Purpose
SERGUI Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.8.1_1168) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8.1_1168) refinement
PHASER model building
SERGUI data collection