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X-RAY DIFFRACTION
Materials and Methods page
4HQB
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.6
    Temperature 293.0
    Details 50 mM MES, pH 5.6, 300 mM potassium chloride, 10 mM magnesium chloride, 5% PEG8000, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 110.7 α = 90
    b = 110.7 β = 90
    c = 58.78 γ = 120
     
    Space Group
    Space Group Name:    P 32
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Details mirrors
    Collection Date 2012-04-17
     
    Diffraction Radiation
    Monochromator Rosenbaum-Rock double crystal sagittal focusing Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.1
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.3
    Resolution(Low) 50
    Number Reflections(All) 35736
    Number Reflections(Observed) 35736
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.068
    B(Isotropic) From Wilson Plot 52.34
    Redundancy 5.7
     
    High Resolution Shell Details
    Resolution(High) 2.3
    Resolution(Low) 2.34
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.726
    Mean I Over Sigma(Observed) 2.3
    Redundancy 5.6
    Number Unique Reflections(All) 1844
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.301
    Resolution(Low) 40.295
    Cut-off Sigma(F) 1.96
    Number of Reflections(all) 35736
    Number of Reflections(Observed) 35711
    Number of Reflections(R-Free) 1798
    Percent Reflections(Observed) 99.84
    R-Factor(Observed) 0.1931
    R-Work 0.1904
    R-Free 0.246
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 61.3
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.301
    Shell Resolution(Low) 2.3632
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2656
    R-Factor(R-Work) 0.2551
    R-Factor(R-Free) 0.3437
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3632
    Shell Resolution(Low) 2.4328
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2560
    R-Factor(R-Work) 0.2427
    R-Factor(R-Free) 0.2868
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4328
    Shell Resolution(Low) 2.5113
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2653
    R-Factor(R-Work) 0.2408
    R-Factor(R-Free) 0.3024
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5113
    Shell Resolution(Low) 2.601
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2586
    R-Factor(R-Work) 0.2317
    R-Factor(R-Free) 0.3137
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.601
    Shell Resolution(Low) 2.7051
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2608
    R-Factor(R-Work) 0.2375
    R-Factor(R-Free) 0.3124
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7051
    Shell Resolution(Low) 2.8282
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2631
    R-Factor(R-Work) 0.2283
    R-Factor(R-Free) 0.2549
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8282
    Shell Resolution(Low) 2.9773
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2602
    R-Factor(R-Work) 0.2157
    R-Factor(R-Free) 0.2956
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9773
    Shell Resolution(Low) 3.1637
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2582
    R-Factor(R-Work) 0.2142
    R-Factor(R-Free) 0.2886
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1637
    Shell Resolution(Low) 3.4079
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2598
    R-Factor(R-Work) 0.1994
    R-Factor(R-Free) 0.2489
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4079
    Shell Resolution(Low) 3.7506
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2629
    R-Factor(R-Work) 0.1781
    R-Factor(R-Free) 0.2624
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7506
    Shell Resolution(Low) 4.2928
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2588
    R-Factor(R-Work) 0.1658
    R-Factor(R-Free) 0.2107
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2928
    Shell Resolution(Low) 5.4064
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2640
    R-Factor(R-Work) 0.1527
    R-Factor(R-Free) 0.2061
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4064
    Shell Resolution(Low) 40.3013
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2580
    R-Factor(R-Work) 0.191
    R-Factor(R-Free) 0.2203
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.07
    f_dihedral_angle_d 16.112
    f_angle_d 1.07
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4703
    Nucleic Acid Atoms 160
    Heterogen Atoms 0
    Solvent Atoms 199
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX-AutoMR
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHENIX-AutoMR
    data collection CBASS