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X-RAY DIFFRACTION
Materials and Methods page
4HPZ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 291.0
    Details 0.05M MgSO4, 0.05M HEPES, 1.6M Li2SO4, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 101.28 α = 90
    b = 101.28 β = 90
    c = 95.59 γ = 120
     
    Space Group
    Space Group Name:    P 31 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2011-09-27
     
    Diffraction Radiation
    Monochromator SAGITALLY FOCUSED Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.9791
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.2
    Resolution(Low) 15
    Number Reflections(All) 29024
    Number Reflections(Observed) 29024
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.069
    Redundancy 10.9
     
    High Resolution Shell Details
    Resolution(High) 2.2
    Resolution(Low) 2.24
    Percent Possible(All) 85.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.202
    Resolution(Low) 14.975
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 29024
    Number of Reflections(Observed) 28963
    Number of Reflections(R-Free) 1468
    Percent Reflections(Observed) 99.86
    R-Factor(All) 0.2079
    R-Factor(Observed) 0.2079
    R-Work 0.206
    R-Free 0.2428
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 7.787
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 7.787
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -15.5741
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.202
    Shell Resolution(Low) 2.2803
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2716
    R-Factor(R-Work) 0.2278
    R-Factor(R-Free) 0.2998
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2803
    Shell Resolution(Low) 2.3713
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2710
    R-Factor(R-Work) 0.2312
    R-Factor(R-Free) 0.294
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3713
    Shell Resolution(Low) 2.4788
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2681
    R-Factor(R-Work) 0.2368
    R-Factor(R-Free) 0.3349
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4788
    Shell Resolution(Low) 2.6088
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2705
    R-Factor(R-Work) 0.2365
    R-Factor(R-Free) 0.2846
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6088
    Shell Resolution(Low) 2.7713
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2738
    R-Factor(R-Work) 0.2288
    R-Factor(R-Free) 0.2853
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7713
    Shell Resolution(Low) 2.9837
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2745
    R-Factor(R-Work) 0.2236
    R-Factor(R-Free) 0.2666
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9837
    Shell Resolution(Low) 3.2811
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2736
    R-Factor(R-Work) 0.231
    R-Factor(R-Free) 0.2343
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2811
    Shell Resolution(Low) 3.7494
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2778
    R-Factor(R-Work) 0.2038
    R-Factor(R-Free) 0.2535
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7494
    Shell Resolution(Low) 4.6995
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2797
    R-Factor(R-Work) 0.1702
    R-Factor(R-Free) 0.1898
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6995
    Shell Resolution(Low) 14.9749
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2889
    R-Factor(R-Work) 0.1916
    R-Factor(R-Free) 0.2126
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.077
    f_dihedral_angle_d 16.364
    f_angle_d 1.184
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3171
    Nucleic Acid Atoms 0
    Heterogen Atoms 15
    Solvent Atoms 160
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASES
    Structure Refinement PHENIX (phenix.refine: dev_596)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_596)
    model building PHASES
    data collection HKL-2000