X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7
Temperature 291.0
Details 0.05M MgSO4, 0.05M HEPES, 1.6M Li2SO4, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 101.28 α = 90
b = 101.28 β = 90
c = 95.59 γ = 120
Symmetry
Space Group P 31 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2011-09-27
Diffraction Radiation
Monochromator Protocol
SAGITALLY FOCUSED Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 0.9791 SSRF BL17U

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 15 100.0 0.069 -- -- 10.9 29024 29024 2.0 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.2 2.24 85.9 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.202 14.975 -- 0.0 29024 28963 1468 99.86 0.2079 0.2079 0.206 0.2428 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.202 2.2803 -- 131 2716 0.2278 0.2998 -- 100.0
X Ray Diffraction 2.2803 2.3713 -- 150 2710 0.2312 0.294 -- 100.0
X Ray Diffraction 2.3713 2.4788 -- 166 2681 0.2368 0.3349 -- 100.0
X Ray Diffraction 2.4788 2.6088 -- 158 2705 0.2365 0.2846 -- 100.0
X Ray Diffraction 2.6088 2.7713 -- 148 2738 0.2288 0.2853 -- 100.0
X Ray Diffraction 2.7713 2.9837 -- 149 2745 0.2236 0.2666 -- 100.0
X Ray Diffraction 2.9837 3.2811 -- 146 2736 0.231 0.2343 -- 100.0
X Ray Diffraction 3.2811 3.7494 -- 140 2778 0.2038 0.2535 -- 100.0
X Ray Diffraction 3.7494 4.6995 -- 133 2797 0.1702 0.1898 -- 100.0
X Ray Diffraction 4.6995 14.9749 -- 147 2889 0.1916 0.2126 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 7.787
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 7.787
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -15.5741
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_chiral_restr 0.077
f_dihedral_angle_d 16.364
f_angle_d 1.184
f_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3171
Nucleic Acid Atoms 0
Heterogen Atoms 15
Solvent Atoms 160

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASES Structure Solution
PHENIX (phenix.refine: dev_596) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: dev_596) refinement
PHASES model building
HKL-2000 data collection