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X-RAY DIFFRACTION
Materials and Methods page
4HPY
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 15% (w/v) PEG8000, 30% isopropanol, 0.1M imidazole pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 41.89 α = 90
    b = 79.15 β = 90
    c = 127.11 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 200
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2012-04-12
     
    Diffraction Radiation
    Monochromator Si220
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1.00
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.5
    Resolution(Low) 20
    Number Reflections(All) 68734
    Number Reflections(Observed) 68734
    Percent Possible(Observed) 100.0
     
    High Resolution Shell Details
    Resolution(High) 1.5
    Resolution(Low) 1.53
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.874
    Redundancy 5.6
    Number Unique Reflections(All) 3359
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.5
    Resolution(Low) 19.892
    Cut-off Sigma(F) 1.36
    Number of Reflections(all) 68657
    Number of Reflections(Observed) 68657
    Number of Reflections(R-Free) 3473
    Percent Reflections(Observed) 99.84
    R-Factor(Observed) 0.1715
    R-Work 0.1707
    R-Free 0.1873
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5
    Shell Resolution(Low) 1.5188
    Number of Reflections(R-Free) 110
    Number of Reflections(R-Work) 2493
    R-Factor(R-Work) 0.2065
    R-Factor(R-Free) 0.2422
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5188
    Shell Resolution(Low) 1.5405
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2571
    R-Factor(R-Work) 0.206
    R-Factor(R-Free) 0.2147
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5405
    Shell Resolution(Low) 1.5635
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2555
    R-Factor(R-Work) 0.1952
    R-Factor(R-Free) 0.215
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5635
    Shell Resolution(Low) 1.5879
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2587
    R-Factor(R-Work) 0.1854
    R-Factor(R-Free) 0.2006
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5879
    Shell Resolution(Low) 1.6139
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2630
    R-Factor(R-Work) 0.1874
    R-Factor(R-Free) 0.1897
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6139
    Shell Resolution(Low) 1.6418
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2541
    R-Factor(R-Work) 0.177
    R-Factor(R-Free) 0.1654
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6418
    Shell Resolution(Low) 1.6716
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2640
    R-Factor(R-Work) 0.1799
    R-Factor(R-Free) 0.2172
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6716
    Shell Resolution(Low) 1.7037
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2522
    R-Factor(R-Work) 0.1757
    R-Factor(R-Free) 0.229
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7037
    Shell Resolution(Low) 1.7385
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2606
    R-Factor(R-Work) 0.1705
    R-Factor(R-Free) 0.215
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7385
    Shell Resolution(Low) 1.7763
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2593
    R-Factor(R-Work) 0.1743
    R-Factor(R-Free) 0.1829
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7763
    Shell Resolution(Low) 1.8176
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2614
    R-Factor(R-Work) 0.1703
    R-Factor(R-Free) 0.2151
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8176
    Shell Resolution(Low) 1.863
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2582
    R-Factor(R-Work) 0.1774
    R-Factor(R-Free) 0.1739
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.863
    Shell Resolution(Low) 1.9133
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2611
    R-Factor(R-Work) 0.1669
    R-Factor(R-Free) 0.2062
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9133
    Shell Resolution(Low) 1.9696
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2589
    R-Factor(R-Work) 0.1617
    R-Factor(R-Free) 0.1742
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9696
    Shell Resolution(Low) 2.0331
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2573
    R-Factor(R-Work) 0.1678
    R-Factor(R-Free) 0.194
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0331
    Shell Resolution(Low) 2.1057
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2606
    R-Factor(R-Work) 0.1576
    R-Factor(R-Free) 0.1876
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1057
    Shell Resolution(Low) 2.1899
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2617
    R-Factor(R-Work) 0.1575
    R-Factor(R-Free) 0.1761
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1899
    Shell Resolution(Low) 2.2894
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2601
    R-Factor(R-Work) 0.1677
    R-Factor(R-Free) 0.1674
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2894
    Shell Resolution(Low) 2.4099
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2613
    R-Factor(R-Work) 0.1688
    R-Factor(R-Free) 0.2092
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4099
    Shell Resolution(Low) 2.5606
    Number of Reflections(R-Free) 186
    Number of Reflections(R-Work) 2589
    R-Factor(R-Work) 0.1802
    R-Factor(R-Free) 0.1871
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5606
    Shell Resolution(Low) 2.7578
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2616
    R-Factor(R-Work) 0.1795
    R-Factor(R-Free) 0.1872
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7578
    Shell Resolution(Low) 3.0345
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2665
    R-Factor(R-Work) 0.1761
    R-Factor(R-Free) 0.1989
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0345
    Shell Resolution(Low) 3.4716
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2648
    R-Factor(R-Work) 0.168
    R-Factor(R-Free) 0.1743
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4716
    Shell Resolution(Low) 4.3662
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2712
    R-Factor(R-Work) 0.1577
    R-Factor(R-Free) 0.1749
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3662
    Shell Resolution(Low) 19.892
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2810
    R-Factor(R-Work) 0.1711
    R-Factor(R-Free) 0.1772
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.067
    f_dihedral_angle_d 12.198
    f_angle_d 0.998
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3335
    Nucleic Acid Atoms 0
    Heterogen Atoms 12
    Solvent Atoms 521
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SERGUI
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHASER
    data collection SERGUI