X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8.5
Temperature 293.0
Details 0.8 M Lithium Chloride, 0.1 M Tris:HCl, 32% (w/v) PEG 4000, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 77.06 α = 90
b = 73.34 β = 111.96
c = 80.54 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 77
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2012-09-21
Diffraction Radiation
Monochromator Protocol
ROSENBAUM-ROCK DOUBLE CRYSTAL SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 1.075 NSLS X29A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.55 50 96.1 0.055 -- -- 5.7 115820 115757 2.0 2.0 19.8
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.55 1.58 94.0 0.8 -- -- 5.7 5637

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.55 39.762 -- 1.35 -- 115697 5783 96.03 -- 0.174 0.1726 0.1999 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.5505 1.5681 -- 180 3520 0.2447 0.2777 -- 93.0
X Ray Diffraction 1.5681 1.5865 -- 190 3560 0.2486 0.3005 -- 94.0
X Ray Diffraction 1.5865 1.6059 -- 174 3618 0.2576 0.311 -- 94.0
X Ray Diffraction 1.6059 1.6262 -- 185 3577 0.2775 0.3052 -- 94.0
X Ray Diffraction 1.6262 1.6476 -- 186 3578 0.2301 0.2595 -- 95.0
X Ray Diffraction 1.6476 1.6702 -- 170 3644 0.1989 0.2249 -- 95.0
X Ray Diffraction 1.6702 1.694 -- 202 3568 0.2029 0.2278 -- 95.0
X Ray Diffraction 1.694 1.7193 -- 184 3617 0.1933 0.256 -- 95.0
X Ray Diffraction 1.7193 1.7462 -- 198 3623 0.193 0.2295 -- 95.0
X Ray Diffraction 1.7462 1.7748 -- 177 3579 0.1946 0.2102 -- 95.0
X Ray Diffraction 1.7748 1.8054 -- 207 3631 0.1975 0.2475 -- 95.0
X Ray Diffraction 1.8054 1.8382 -- 194 3686 0.189 0.2214 -- 96.0
X Ray Diffraction 1.8382 1.8736 -- 186 3633 0.208 0.2499 -- 96.0
X Ray Diffraction 1.8736 1.9118 -- 200 3599 0.2278 0.2464 -- 95.0
X Ray Diffraction 1.9118 1.9534 -- 205 3631 0.1918 0.2377 -- 96.0
X Ray Diffraction 1.9534 1.9988 -- 188 3657 0.1768 0.2122 -- 96.0
X Ray Diffraction 1.9988 2.0488 -- 197 3694 0.1704 0.1852 -- 97.0
X Ray Diffraction 2.0488 2.1042 -- 189 3664 0.1729 0.2177 -- 96.0
X Ray Diffraction 2.1042 2.1661 -- 213 3706 0.1698 0.1936 -- 97.0
X Ray Diffraction 2.1661 2.2361 -- 206 3670 0.1661 0.1825 -- 97.0
X Ray Diffraction 2.2361 2.316 -- 194 3724 0.1671 0.2059 -- 97.0
X Ray Diffraction 2.316 2.4087 -- 193 3705 0.1664 0.2064 -- 97.0
X Ray Diffraction 2.4087 2.5183 -- 194 3738 0.1754 0.1875 -- 98.0
X Ray Diffraction 2.5183 2.651 -- 191 3741 0.1791 0.2305 -- 98.0
X Ray Diffraction 2.651 2.8171 -- 186 3744 0.1758 0.2282 -- 98.0
X Ray Diffraction 2.8171 3.0345 -- 187 3795 0.1744 0.2144 -- 98.0
X Ray Diffraction 3.0345 3.3398 -- 221 3754 0.1722 0.2079 -- 98.0
X Ray Diffraction 3.3398 3.8227 -- 205 3772 0.1521 0.1552 -- 98.0
X Ray Diffraction 3.8227 4.8149 -- 188 3766 0.1333 0.1448 -- 97.0
X Ray Diffraction 4.8149 39.7748 -- 193 3720 0.1642 0.1885 -- 94.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 31.7635
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 13.242
f_plane_restr 0.005
f_chiral_restr 0.072
f_angle_d 1.072
f_bond_d 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6284
Nucleic Acid Atoms 0
Heterogen Atoms 15
Solvent Atoms 782

Software

Computing
Computing Package Purpose
CBASS Data Collection
HKL-3000 Data Reduction (intensity integration)
HKL Data Reduction (data scaling)
Phaser Structure Solution
PHENIX (phenix.refine: 1.8.1_1168) Structure Refinement
Software
Software Name Purpose
pdb_extract version: 3.11 data extraction
phenix refinement
HKL data reduction