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X-RAY DIFFRACTION
Materials and Methods page
4HPO
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 14% (w/v) PEG 8000, 2% (v/v) MPD, 0.1 M imidazole pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 140.59 α = 90
    b = 75.8 β = 111.99
    c = 54.69 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 200
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2012-03-10
     
    Diffraction Radiation
    Monochromator Si (220)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-BM
    Wavelength List 1.00
    Site APS
    Beamline 22-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.69
    Resolution(Low) 50
    Number Reflections(All) 59036
    Number Reflections(Observed) 53546
    Percent Possible(Observed) 90.7
     
    High Resolution Shell Details
    Resolution(High) 1.694
    Resolution(Low) 1.73
    Percent Possible(All) 56.1
    R Merge I(Observed) 0.387
    Mean I Over Sigma(Observed) 1.88
    Redundancy 2.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.694
    Resolution(Low) 24.806
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 59149
    Number of Reflections(Observed) 53364
    Number of Reflections(R-Free) 2654
    Percent Reflections(Observed) 90.22
    R-Factor(Observed) 0.1866
    R-Work 0.1854
    R-Free 0.2108
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.694
    Shell Resolution(Low) 1.725
    Number of Reflections(R-Free) 85
    Number of Reflections(R-Work) 1564
    R-Factor(R-Work) 0.2612
    R-Factor(R-Free) 0.3461
    Percent Reflections(Observed) 53.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.725
    Shell Resolution(Low) 1.7582
    Number of Reflections(R-Free) 92
    Number of Reflections(R-Work) 1795
    R-Factor(R-Work) 0.2524
    R-Factor(R-Free) 0.2445
    Percent Reflections(Observed) 61.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7582
    Shell Resolution(Low) 1.794
    Number of Reflections(R-Free) 112
    Number of Reflections(R-Work) 2080
    R-Factor(R-Work) 0.2494
    R-Factor(R-Free) 0.3347
    Percent Reflections(Observed) 71.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.794
    Shell Resolution(Low) 1.833
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2327
    R-Factor(R-Work) 0.2373
    R-Factor(R-Free) 0.2958
    Percent Reflections(Observed) 79.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.833
    Shell Resolution(Low) 1.8757
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2507
    R-Factor(R-Work) 0.2376
    R-Factor(R-Free) 0.2469
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8757
    Shell Resolution(Low) 1.9225
    Number of Reflections(R-Free) 113
    Number of Reflections(R-Work) 2599
    R-Factor(R-Work) 0.242
    R-Factor(R-Free) 0.2543
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9225
    Shell Resolution(Low) 1.9745
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2763
    R-Factor(R-Work) 0.2292
    R-Factor(R-Free) 0.2852
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9745
    Shell Resolution(Low) 2.0326
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2868
    R-Factor(R-Work) 0.209
    R-Factor(R-Free) 0.2405
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0326
    Shell Resolution(Low) 2.0981
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2881
    R-Factor(R-Work) 0.1972
    R-Factor(R-Free) 0.2206
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0981
    Shell Resolution(Low) 2.1731
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2896
    R-Factor(R-Work) 0.1932
    R-Factor(R-Free) 0.2115
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1731
    Shell Resolution(Low) 2.26
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2868
    R-Factor(R-Work) 0.2087
    R-Factor(R-Free) 0.2749
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.26
    Shell Resolution(Low) 2.3628
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2933
    R-Factor(R-Work) 0.2159
    R-Factor(R-Free) 0.2441
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3628
    Shell Resolution(Low) 2.4873
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2937
    R-Factor(R-Work) 0.2014
    R-Factor(R-Free) 0.2228
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4873
    Shell Resolution(Low) 2.643
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2932
    R-Factor(R-Work) 0.2045
    R-Factor(R-Free) 0.2328
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.643
    Shell Resolution(Low) 2.8468
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2963
    R-Factor(R-Work) 0.2036
    R-Factor(R-Free) 0.2187
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8468
    Shell Resolution(Low) 3.1327
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 2919
    R-Factor(R-Work) 0.1967
    R-Factor(R-Free) 0.2363
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1327
    Shell Resolution(Low) 3.5849
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 2963
    R-Factor(R-Work) 0.1787
    R-Factor(R-Free) 0.2014
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5849
    Shell Resolution(Low) 4.5122
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2961
    R-Factor(R-Work) 0.1485
    R-Factor(R-Free) 0.1757
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5122
    Shell Resolution(Low) 24.809
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2954
    R-Factor(R-Work) 0.1537
    R-Factor(R-Free) 0.1595
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.077
    f_dihedral_angle_d 14.758
    f_angle_d 1.105
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3406
    Nucleic Acid Atoms 0
    Heterogen Atoms 24
    Solvent Atoms 403
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SERGUI
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHASER
    data collection SERGUI