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X-RAY DIFFRACTION
Materials and Methods page
4HOU
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 295.15
    Details pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 295.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 84.47 α = 90
    b = 176.95 β = 130.13
    c = 55.14 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 105
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2010-01-01
     
    Diffraction Radiation
    Monochromator double crystal monochromator (DCM) with an indirectly cryo-cooled first crystal and sagittally focusing second crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type CLSI BEAMLINE 08ID-1
    Wavelength List 0.979
    Site CLSI
    Beamline 08ID-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 2.6
    Resolution(High) 1.95
    Resolution(Low) 50
    Number Reflections(All) 45919
    Number Reflections(Observed) 45919
    Percent Possible(Observed) 98.0
     
    High Resolution Shell Details
    Resolution(High) 1.95
    Resolution(Low) 2.02
    Percent Possible(All) 95.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.95
    Resolution(Low) 30.521
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 46869
    Number of Reflections(Observed) 44239
    Number of Reflections(R-Free) 2630
    Percent Reflections(Observed) 95.59
    R-Factor(Observed) 0.2036
    R-Work 0.2016
    R-Free 0.2324
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9302
    Shell Resolution(Low) 1.9653
    Number of Reflections(R-Free) 70
    Number of Reflections(R-Work) 1632
    R-Factor(R-Work) 0.2527
    R-Factor(R-Free) 0.2874
    Percent Reflections(Observed) 69.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9653
    Shell Resolution(Low) 2.0031
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1986
    R-Factor(R-Work) 0.2368
    R-Factor(R-Free) 0.2773
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0031
    Shell Resolution(Low) 2.044
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2100
    R-Factor(R-Work) 0.2191
    R-Factor(R-Free) 0.2635
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.044
    Shell Resolution(Low) 2.0884
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2151
    R-Factor(R-Work) 0.2208
    R-Factor(R-Free) 0.2899
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0884
    Shell Resolution(Low) 2.137
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2151
    R-Factor(R-Work) 0.2088
    R-Factor(R-Free) 0.2791
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.137
    Shell Resolution(Low) 2.1904
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2201
    R-Factor(R-Work) 0.2026
    R-Factor(R-Free) 0.2602
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1904
    Shell Resolution(Low) 2.2496
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2206
    R-Factor(R-Work) 0.1947
    R-Factor(R-Free) 0.2259
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2496
    Shell Resolution(Low) 2.3158
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2248
    R-Factor(R-Work) 0.1979
    R-Factor(R-Free) 0.234
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3158
    Shell Resolution(Low) 2.3905
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2260
    R-Factor(R-Work) 0.2017
    R-Factor(R-Free) 0.2638
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3905
    Shell Resolution(Low) 2.4759
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2218
    R-Factor(R-Work) 0.1995
    R-Factor(R-Free) 0.2419
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4759
    Shell Resolution(Low) 2.575
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2285
    R-Factor(R-Work) 0.2104
    R-Factor(R-Free) 0.2182
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.575
    Shell Resolution(Low) 2.6922
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2219
    R-Factor(R-Work) 0.2036
    R-Factor(R-Free) 0.235
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6922
    Shell Resolution(Low) 2.834
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2245
    R-Factor(R-Work) 0.2084
    R-Factor(R-Free) 0.2604
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.834
    Shell Resolution(Low) 3.0114
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2271
    R-Factor(R-Work) 0.2311
    R-Factor(R-Free) 0.2596
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0114
    Shell Resolution(Low) 3.2437
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2306
    R-Factor(R-Work) 0.2164
    R-Factor(R-Free) 0.2481
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2437
    Shell Resolution(Low) 3.5697
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2259
    R-Factor(R-Work) 0.2013
    R-Factor(R-Free) 0.2613
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5697
    Shell Resolution(Low) 4.0851
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2296
    R-Factor(R-Work) 0.185
    R-Factor(R-Free) 0.2301
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0851
    Shell Resolution(Low) 5.1429
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2289
    R-Factor(R-Work) 0.1775
    R-Factor(R-Free) 0.2014
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1429
    Shell Resolution(Low) 30.5244
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 2286
    R-Factor(R-Work) 0.2062
    R-Factor(R-Free) 0.1956
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.078
    f_dihedral_angle_d 15.219
    f_angle_d 1.138
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4046
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 238
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SOLVE
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building SOLVE
    data collection HKL-2000