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X-RAY DIFFRACTION
Materials and Methods page
4HOS
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.5
    Temperature 295.15
    Details pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 295.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 54.47 α = 90
    b = 84.94 β = 106.75
    c = 60.93 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 105
     
    Diffraction Detector
    Detector CCD
    Type RIGAKU SATURN 944+
    Collection Date 2012-07-15
     
    Diffraction Radiation
    Monochromator VARIMAX HF
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007 HF
    Wavelength 1.54
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.4
    Resolution(High) 2
    Resolution(Low) 50
    Number Reflections(Observed) 36176
    Percent Possible(Observed) 99.9
     
    High Resolution Shell Details
    Resolution(High) 2.0
    Resolution(Low) 2.07
    Percent Possible(All) 99.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.0
    Resolution(Low) 31.79
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 38922
    Number of Reflections(Observed) 36076
    Number of Reflections(R-Free) 2846
    Percent Reflections(Observed) 99.6
    R-Factor(Observed) 0.177
    R-Work 0.175
    R-Free 0.207
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9949
    Shell Resolution(Low) 2.0293
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 1582
    R-Factor(R-Work) 0.2238
    R-Factor(R-Free) 0.2702
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0293
    Shell Resolution(Low) 2.0662
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1628
    R-Factor(R-Work) 0.2264
    R-Factor(R-Free) 0.3279
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0662
    Shell Resolution(Low) 2.106
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 1681
    R-Factor(R-Work) 0.2097
    R-Factor(R-Free) 0.2612
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.106
    Shell Resolution(Low) 2.1489
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1652
    R-Factor(R-Work) 0.1978
    R-Factor(R-Free) 0.28
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1489
    Shell Resolution(Low) 2.1956
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1659
    R-Factor(R-Work) 0.1912
    R-Factor(R-Free) 0.2413
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1956
    Shell Resolution(Low) 2.2467
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1666
    R-Factor(R-Work) 0.1984
    R-Factor(R-Free) 0.2646
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2467
    Shell Resolution(Low) 2.3029
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1638
    R-Factor(R-Work) 0.1862
    R-Factor(R-Free) 0.2516
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3029
    Shell Resolution(Low) 2.3651
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 1665
    R-Factor(R-Work) 0.1918
    R-Factor(R-Free) 0.2515
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3651
    Shell Resolution(Low) 2.4347
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1651
    R-Factor(R-Work) 0.1846
    R-Factor(R-Free) 0.2305
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4347
    Shell Resolution(Low) 2.5133
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 1676
    R-Factor(R-Work) 0.183
    R-Factor(R-Free) 0.2181
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5133
    Shell Resolution(Low) 2.603
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1643
    R-Factor(R-Work) 0.1853
    R-Factor(R-Free) 0.2537
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.603
    Shell Resolution(Low) 2.7072
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1657
    R-Factor(R-Work) 0.188
    R-Factor(R-Free) 0.2377
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7072
    Shell Resolution(Low) 2.8303
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 1681
    R-Factor(R-Work) 0.1884
    R-Factor(R-Free) 0.2158
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8303
    Shell Resolution(Low) 2.9795
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 1686
    R-Factor(R-Work) 0.1987
    R-Factor(R-Free) 0.2234
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9795
    Shell Resolution(Low) 3.166
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 1651
    R-Factor(R-Work) 0.196
    R-Factor(R-Free) 0.2537
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.166
    Shell Resolution(Low) 3.4102
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 1668
    R-Factor(R-Work) 0.185
    R-Factor(R-Free) 0.2259
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4102
    Shell Resolution(Low) 3.7529
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 1673
    R-Factor(R-Work) 0.1677
    R-Factor(R-Free) 0.167
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7529
    Shell Resolution(Low) 4.2948
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 1659
    R-Factor(R-Work) 0.1466
    R-Factor(R-Free) 0.1545
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2948
    Shell Resolution(Low) 5.4066
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1694
    R-Factor(R-Work) 0.1454
    R-Factor(R-Free) 0.1587
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4066
    Shell Resolution(Low) 31.7976
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1720
    R-Factor(R-Work) 0.141
    R-Factor(R-Free) 0.1547
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.07
    f_dihedral_angle_d 14.778
    f_angle_d 0.951
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3937
    Nucleic Acid Atoms 73
    Heterogen Atoms 1
    Solvent Atoms 364
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHASER
    data collection HKL-2000